Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2000Advanced Methods for surface and subsurface defect characterization of optical components
Steinert, J.; Gliech, S.; Wuttig, A.; Duparre, A.; Truckenbrodt, H.
Conference Paper
1999Surface roughness and subsurface damage characterization of fused silica substrates
Wuttig, A.; Steinert, J.; Duparre, A.; Truckenbrodt, H.
Conference Paper
1998AFM and light scattering measurements of optical thin films for applications in the UV spectral region
Jakobs, S.; Duparre, A.; Truckenbrodt, H.
Journal Article
1998Interfacial roughness and related scatter in UV-optical coatings
Jacobs, S.; Duparre, A.; Truckenbrodt, H.
Journal Article
1997Lichtmessanordnung zur Detektion von Oberflaechendefekten
Truckenbrodt, H.; Schroeter, T.; Weigel, T.
Patent
1996Surface finish assessment of synthetic quartz glass
Kiesel, A.; Duparre, A.; Haase, M.; Coriand, F.; Truckenbrodt, H.
Conference Paper
1994Roughness and scattering measurements on thin films for UV/VIS applications
Duparre, A.; Kiesel, A.; Kaiser, N.; Truckenbrodt, H.; Schuhmann, U.
Conference Paper
1993Microtopography investigations of optical surfaces and thin films by light scattering, optical profilometry, and automatic force microscopy
Duparre, A.; Kaiser, N.; Truckenbrodt, H.; Berger, M.; Köhler, A.
Conference Paper
1993Real-time detection of surface damage by direct assessment of the BRDF
Rothe, H.; Duparre, A.; Truckenbrodt, H.; Timm, M.
Conference Paper
1992Roughness and defect characterization of optical surfaces by light scattering measurements
Truckenbrodt, H.; Duparre, A.; Schuhmann, U.
Conference Paper
1992Vergleich fraktaler Parameter von Rauheitsmessungen an glatten Oberflächen mit profilometrischen und Streulichtmessungen
Neubert, J.; Truckenbrodt, H.; Usbeck, K.; Harnisch, B.
Conference Paper