Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2009Spatially resolved characterization of silicon as-cut wafers with photoluminescence imaging
Giesecke, J.A.; The, M.; Kasemann, M.; Warta, W.
Journal Article
2009Spatially resolved determination of the dark saturation current by electroluminescence imaging
Glatthaar, M.; Giesecke, J.; Kasemann, M.; Haunschild, J.; The, M.; Warta, W.; Rein, S.
Conference Paper
2009Spatially resolved determination of the dark saturation current of silicon solar cells from electroluminescence images
Glatthaar, M.; Giesecke, J.; Kasemann, M.; Haunschild, J.; The, M.; Warta, W.; Rein, S.
Journal Article
2008Determination of minority carrier diffusion lengths in silicon solar cells from photoluminescence images
Giesecke, J.; Kasemann, M.; Schubert, M.C.; Michl, B.; The, M.; Warta, W.; Würfel, P.
Conference Paper
2008Progress in silicon solar cell characterization with infrared imaging methods
Kasemann, M.; Kwapil, W.; Walter, B.; Giesecke, J.; Michl, B.; The, M.; Wagner, J.-M.; Bauer, J.; Schütt, A.; Carstensen, J.; Kampwerth, H.; Gundel, P.; Schubert, M.C.; Bardos, R.A.; Föll, H.; Nagel, H.; Würfel, P.; Trupke, T.; Breitenstein, O.; Warta, W.; Glunz, S.W.
Conference Paper
2008Spatially resolved characterisation of silicon as-cut wafers with photoluminescence imaging
The, M.; Giesecke, J.; Kasemann, M.; Warta, W.
Conference Paper
2008Spatially resolved luminescence spectroscopy on multicrystalline silicon
Schubert, M.C.; Gundel, P.; The, M.; Warta, W.; Romero, M.J.; Ostapenko, S.; Arguirov, T.
Conference Paper
2008Spatially resolved silicon solar cell characterization using infrared imaging methods
Kasemann, M.; Kwapil, M.; Schubert, M.C.; Habenicht, H.; Walter, B.; The, M.; Kontermann, S.; Rein, S.; Breitenstein, O.; Bauer, J.; Lotnyk, A.; Michl, B.; Nagel, H.; Schütt, A.; Carstensen, J.; Föll, H.; Trupke, T.; Augarten, Y.; Kampwerth, H.; Bardos, R.A.; Pingel, S.; Berghold, J.; Warta, W.; Glunz, S.W.
Conference Paper
2007Advances in infrared imaging methods for silicon material characterization
Schubert, M.C.; The, M.; Gundel, P.; Kasemann, M.; Pingel, S.; Warta, W.
Conference Paper
2007Progress with luminescence imaging for the characterisation of silicon wafers and solar cells
Trupke, T.; Bardos, R.A.; Abbott, M.D.; Würfel, P.; Pink, E.; Augarten, Y.; Chen, F.W.; Fisher, K.; Cotter, J.E.; Kasemann, M.; Rüdiger, M.; Kontermann, S.; Schubert, M.C.; The, M.; Glunz, S.W.; Warta, W.; Macdonald, D.; Tan, J.; Cuevas, A.; Bauer, J.; Gupta, R.; Breitenstein, O.; Buonassisi, T.; Tarnowski, G.; Lorenz, A.; Hartmann, H.P.; Neuhaus, D.H.; Fernandez, J.M.
Conference Paper
2007Quantitative carrier lifetime images optically measured on rough silicon wafers
Schubert, M.; Pingel, S.; The, M.; Warta, W.
Journal Article
2007Quantitative lifetime measurements with photoluminescence imaging
The, M.; Schubert, M.C.; Warta, W.
Conference Paper
2006Comparison of luminescence imaging and illuminated lock-in thermography on silicon solar cells
Kasemann, M.; Schubert, M.C.; The, M.; Köber, M.; Hermle, M.; Warta, W.
Journal Article