Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2012Process characterisation of MWT solar cells - a new method to analyse via contacts
Reitenbach, V.; Spitz, M.; Drews, A.; Weiß, M.; Ould Chighali, E.; Thaidigsmann, B.; Lohmüller, E.; Knorz, A.; Clement, F.; Wolf, A.; Biro, D.; Preu, R.
Conference Paper
2011Impact of Potential Barriers at Grain Boundaries of Multi Crystalline Silicon Wafers on Inductively Coupled Resistivity Measurements
Spitz, M.; Rein, S.
Conference Paper
2009Impact of compensated solar-grade silicon on Czochralski silicon wafers and solar cells
Rein, S.; Kwapil, W.; Geilker, J.; Emanuel, G.; Spitz, M.; Reis, I.; Weil, A.; Biro, D.; Glatthaar, M.; Soiland, A.-K.; Enebakk, E.; Tronstad, R.
Conference Paper
2008Analyzing the effects of laterally varying emitter sheet resistance in combination with contact resistance
Grote, D.; Hermle, M.; Wotke, E.; Belledin, U.; Hörteis, M.; Spitz, M.; Kasemann, M.; Rein, S.; Biro, D.; Warta, W.
Conference Paper
2008Industrially feasible mc-Si metal wrap through (MWT) solar cells with high emitter sheet resistances exceeding 16% efficiency
Clement, F.; Belledin, U.; Wotke, E.; Menkö, M.; Kubera, T.; Hönig, R.; Harmel, C.; Spitz, M.; Wirth, H.; Biro, D.; Preu, R.
Conference Paper
2007Fast inductive inline measurement of the emitter sheet resistance in industrial solar cell fabrication
Spitz, M.; Belledin, U.; Rein, S.
Conference Paper
2007Verfahren zur induktiven Messung eines Schichtwiderstandes einer in einen multikristallinen Halbleiterwafer eingebrachten Dotierungsschicht
Spitz, M.; Rein, S.
Patent
2001A stand-alone 32 Kbit EEPROM for high-temperature applications
Alfring, M.; Spitz, M.; Fiedler, H.-L.
Book Article
2000A 1-Kbit EEPROM in SIMOX technology for high-temperature applications up to 250 deg C
Gogl, D.; Fiedler, H.-L.; Spitz, M.; Parmentier, B.
Journal Article