Fraunhofer-Gesellschaft

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Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2019Gradients of microstructure, stresses and mechanical properties in a multi-layered diamond thin film revealed by correlative cross-sectional nano-analytics
Gruber, David P.; Todt, Juraj; Wöhrl, Nicolas; Zalesak, Jakub; Tkadletz, Michael; Kubec, Adam; Niese, Sven; Burghammer, Manfred; Rosenthal, Martin; Sternschulte, Hadwig; Pfeifenberger, Manuel J.; Sartory, Bernhard; Keckes, Jozef
Journal Article
201830 nm X-ray focusing correlates oscillatory stress, texture and structural defect gradients across multilayered TiN-SiOx thin film
Keckes, Jozef; Daniel, Rostislav; Todt, Juraj; Zalesak, Jakub; Sartory, Bernhard; Braun, Stefan; Gluch, Jürgen; Rosenthal, Martin; Burghammer, Manfred; Mitterer, C.; Niese, S.; Kubec, Adam
Journal Article