Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2014Determination of the minority carrier lifetime in crystalline silicon thin-film material
Walter, D.; Rosenits, P.; Berger, B.; Reber, S.; Warta, W.
Journal Article
2014Evaluation of the influence of an embedded porous silicon layer on the bulk lifetime of epitaxial layers and the interface recombination at the epitaxial layer/porous silicon interface
Radhakrishnan, H.S.; Dross, F.; Debucquoy, M.; Rosenits, P.; Nieuwenhuysen, K. van; Gordon, I.; Poortmans, J.; Mertens, R.
Journal Article
2011Epitaxially grown crystalline silicon thin-film solar cells reaching 16.5% efficiency with basic cell process
Rosenits, P.; Kopp, F.; Reber, S.
Journal Article
2011Erratum on "Determining the defect parameters of the deep aluminum-related defect center in silicon"
Rosenits, P.; Roth, T.; Glunz, S.W.
Journal Article
2010Determining the minority carrier lifetime in crystalline silicon thin-film material
Rosenits, P.; Kopp, F.; Walter, D.; Reber, S.; Warta, W.
Conference Paper
2010Determining the minority carrier lifetime in epitaxial silicon layers by micro-wave-detected photoconductivity measurements
Walter, D.; Rosenits, P.; Kopp, F.; Reber, S.; Berger, B.; Warta, W.
Conference Paper
2010Influence of different excitation spectra on the measured carrier lifetimes in quasi-steady-state photoconductance measurements
Rosenits, P.; Roth, T.; Warta, W.; Glunz, S.W.
Journal Article
2010Minority Carrier Lifetime in Silicon Wafers and Thin-Film Material
Rosenits, P.
Journal Article
2010Simultaneous determination of carrier lifetime and net dopant concentration of silicon wafers from photoluminescence
Giesecke, J.A.; Walter, D.; Kopp, F.; Rosenits, P.; Schubert, M.C.; Warta, W.
Conference Paper
2009Determining the excess carrier lifetime in crystalline silicon thin-films by photoluminescence measurements
Rosenits, P.; Roth, T.; Warta, W.; Reber, S.; Glunz, S.W.
Journal Article
2009Lifetime studies on crystalline silicon thin-film material by photoluminescence imaging
Kopp, F.; Rosenits, P.; Roth, T.; Schmich, E.; Reber, S.; Warta, W.
Conference Paper
2009Photoconductance-based excess carrier lifetime measurements on unpassivated silicon samples
Roth, T.; Rosenits, P.; Warta, W.; Glunz, S.W.
Conference Paper
2009Quasi-steady-state photoconductance measurements on crystalline silicon thin-film material
Rosenits, P.; Kopp, F.; Roth, T.; Warta, W.; Reber, S.; Glunz, S.W.
Conference Paper
2008Comparison of photoconductance- and photoluminescence-based lifetime measurement techniques
Roth, T.; Rosenits, P.; Rüdiger, M.; Warta, W.; Glunz, S.W.
Conference Paper
2008Lifetime studies on crystalline silicon thin-films by photoluminescence measurements
Rosenits, P.; Roth, T.; Reber, S.; Warta, W.; Glunz, S.W.
Conference Paper
2008Verfahren zur Bestimmung der Überschussladungsträgerlebensdauer in einer Halbleiterschicht
Rosenits, P.; Roth, T.; Glunz, S.
Patent
2007Charakterisierung elektrisch aktiver Defekte in Silizium mittels Deep-Level Transient Sprectroscopy und Lebensdauerspektroskopie
Rosenits, P.
Thesis
2007Detailed studies of manganese in silicon using lifetime spectroscopy and deep-level transient spectroscopy
Rosenits, P.; Roth, T.; Diez, S.; Macdonald, D.; Glunz, S.W.
Conference Paper
2007Determining the defect parameters of the deep aluminum-related defect center in silicon
Rosenits, P.; Roth, T.; Glunz, S.W.; Beljakowa, S.
Journal Article
2007Electronic properties and dopant pairing behavior of manganese in boron-doped silicon
Roth, T.; Rosenits, P.; Diez, S.; Glunz, S.W.
Journal Article
2007Photoluminescence lifetime spectroscopy - Surface recombination analysis
Roth, T.; Rüdiger, M.; Rosenits, P.; Diez, S.; Trupke, T.; Bardos, R.A.; Glunz, S.W.
Conference Paper
2007Recombination activity of manganese in p- and n-type crystalline silicon
Macdonald, D.; Rosenits, P.; Deenapanray, P.N.K.
Journal Article