Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2020Assessment of Influencing Factors on Lifetime-Based Defect Analysis
Post, R.; Niewelt, T.; Kwapil, W.; Schubert, M.C.
Conference Paper
2020Review and Recent Development in Combining Photoluminescence- and Electroluminescence-Imaging with Carrier Lifetime Measurements via Modulated Photoluminescence at Variable Temperatures
Höffler, H.; Schindler, F.; Brand, A.; Herrmann, D.; Eberle, R.; Post, R.; Kessel, A.; Greulich, J.; Schubert, M.C.
Conference Paper
2019Imaging Interstitial Iron Concentrations in Gallium-Doped Silicon Wafers
Post, R.; Niewelt, T.; Schön, J.; Schindler, F.; Schubert, M.C.
Journal Article
2019Investigation of LeTID where we can Control it - Application of FZ Silicon for Defect Studies
Niewelt, T.; Post, R.; Schindler, F.; Kwapil, W.; Schubert, M.C.
Conference Paper
2019Re-evaluation of the SRH-Parameters for the FeGa Defect
Post, R.; Niewelt, T.; Yang, W.; Macdonald, D.; Kwapil, W.; Schubert, M.C.
Conference Paper
2018Iron Imaging on Ga Doped Wafers
Post, R.; Niewelt, T.; Schön, J.; Schindler, F.; Schubert, M.C.
Presentation
2018Limiting Effects in Crystalline Silicon for High-Efficiency Solar Cells
Niewelt, T.; Richter, A.; Eberle, R.; Post, R.; Schön, J.; Schindler, F.; Hermle, M.; Kwapil, W.; Schubert, M.
Presentation