Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2018Cathodoluminescence spectroscopy for failure analysis and process development of GaN-based microelectronic devices
Monachon, C.; Zielinski, M.S.; Berney, J.; Poppitz, David; Graff, Andreas; Breuer, Steffen; Kirste, Lutz
Conference Paper
2018Physical failure analysis methods for wide band gap semiconductor devices
Graff, A.; Simon-Najasek, M.; Poppitz, D.; Altmann, F.
Conference Paper
2017Exploring the thermal limit of GaN power devices under extreme overload conditions
Pribahsnik, F.P.; Nelhiebel, M.; Mataln, M.; Bernardoni, M.; Prechtl, G.; Altmann, F.; Poppitz, D.; Lindemann, A.
Journal Article
2017Failure analysis and defect inspection of electronic devices by high resolution cathodoluminescence
Monachon, C.; Zielinskl, M.S.; Gachet, D.; Sonderegger, S.; Muckenhirn, S.; Barney, J.; Poppitz, D.; Graff, A.; Breuer, S.; Kirste, L.
Conference Paper
2017Ion Beam Assisted Deposition of Thin Epitaxial GaN Films
Rauschenbach, B.; Lotnyk, A.; Neumann, L.; Poppitz, D.; Gerlach, J.W.
Journal Article
2016Correlation of gate leakage and local strain distribution in GaN/AlGaN HEMT structures
Broas, M.; Graff, A.; Simon-Najasek, M.; Poppitz, D.; Altmann, F.; Jung, H.; Blanck, H.
Journal Article