Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2017Pulsed laser beam identification of SEE-sensitive regions and observation of additional failure modes relevant for RHA in Digital Isolators
Schmitz, Simone; Steffens, Michael; Metzger, Stefan; Wolf, Raphael; Beck, Peter; Wind, Michael; Poizat, Marc
Presentation
2017Pulsed laser beam identification of SEE-sensitive regions and observation of additional failure modes relevant for RHA in Digital Isolators
Steffens, Michael; Metzger, Stefan; Wolf, Raphael; Beck, Peter; Wind, Michael; Poizat, Marc
Poster
2017Total ionizing dose tests of Power Bipolar Transistors and SiC power devices for JUICE
Steffens, Michael; Höffgen, Stefan; Poizat, Marc
Poster
2016Comprehensive radiation characterization of digital isolators
Wind, Michael; Bagalkote, Jayasimha; Clemens, Peter; Kündgen, Tobias; Latocha, Marcin; Lennartz, Wilhelm; Metzger, Stefan; Poizat, Marc; Ruge, Sven; Steffens, Michael; Beck, Peter
Conference Paper
2012Influence of beam conditions and energy for SEE testing
Ferlet-Cavrois, V.; Schwank, J.R.; Liu, S.; Muschitiello, M.; Beutier, T.; Javanainen, A.; Hedlund, A.; Poivey, C.; Mohammadzadeh, Ali; Harboe-Sorensen, Reno; Santin, Giovanni; Nickson, Bob; Menicucci, A.; Binois, C.; Peyre, D.; Höffgen, Stefan Klaus; Metzger, Stefan; Schardt, D.; Kettunen, H.; Virtanen, A.; Berger, G.; Piquet, B.; Foy, J.-C.; Zafrani, M.; Truscott, P.; Poizat, M.; Bezerra, F.
Journal Article
2011Influence of beam conditions and energy for SEE testing
Ferlet-Cavrois, V.; Schwank, J.R.; Liu, S.; Muschitiello, M.; Beutier, Th.; Javanainen, A.; Hedlund, A.; Poivey, C.; Zadeh, A.; Harboe-Sorensen, R.; Santin, G.; Nickson, B.; Menicucci, A.; Binois, C.; Peyre, D.; Hoeffgen, S.K.; Metzger, S.; Schardt, D.; Kettunen, H.; Virtanen, A.; Berger, G.; Piquet, B.; Foy, J.-C.; Zafrani, M.; Truscott, P.; Poizat, M.; Bezerra, F.
Conference Paper