Fraunhofer-Gesellschaft

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Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2015Quantitative ultrasonic characterization of c-axis oriented polycrystalline AlN thin film for smart device application
Habib, A.; Shelke, A.; Vogel, M.; Brand, S.; Jiang, X.; Pietsch, U.; Banerjee, S.; Kundu, T.
Journal Article
2011Tuning the structure and the magnetic properties of metallo-supramolecular polyelectrolyte-amphiphile complexes
Schwarz, G.; Bodenthin, Y.; Tomkowicz, Z.; Haase, W.; Geue, T.; Kohlbrecher, J.; Pietsch, U.; Kurth, D.G.
Journal Article
2006Effect of molecular weight on the structure and crystallinity of poly(3-hexylthiophene)
Zen, A.; Saphiannikova, M.; Neher, D.; Grenzer, J.; Grigorian, S.; Pietsch, U.; Asawapirom, U.; Janietz, S.; Scherf, U.; Lieberwirth, I.; Wegner, G.
Journal Article
2003Thin layers of columns of an amphiphilic hexa-peri-hexabenzocoronene at silicon wafer surfaces
Kubowicz, S.; Pietsch, U.; Watson, M.D.; Tchebotareva, N.; Müllen, K.; Thünemann, A.F.
Journal Article
2003X-ray reflectivity study of an amphiphilic hexa-peri-hexabenzocoronene at a structured silicon wafer surface
Kubowicz, S.; Thünemann, A.F.; Geue, T.M.; Pietsch, U.; Watson, M.D.; Tchebotareva, N.; Müllen, K.
Journal Article
1999High-resolution X-ray scattering from thin films and multilayers
Holy, V.; Pietsch, U.; Baumbach, T.
Book
1999In Situ Characterization of Strain Distribution in Broad-Area High-Power Lasers under Operation by High-Resolution X-Ray Diffraction and Topography Using Synchrotron Radiation
Zeimer, U.; Baumbach, T.; Grenzer, J.; Lübbert, D.; Pietsch, U.; Mazuelas, A.; Erbert, G.
Journal Article
1999In-plane strain distribution in free-standing GaAs/InGaAs/GaAs single quantum well surface nanostructures on GaAs(001)
Pietsch, U.; Baumbach, T.; Darowski, N.; Forchel, A.; Wang, K.H.; Wiebach, T.; Ulyanenkov, A.
Journal Article
1999Lateral Arrangement of Self-Assembled Quantum dots in an SiGe/Si Superlattice
Bauer, G.; Darowski, N.; Holy, V.; Lübbert, D.; Pietsch, U.; Zerlauth, S.; Stangl, J.
Journal Article
1999Strain investigation of low strained buried gratings by grazing incidence X-Ray diffraction and elasticity theory
Lübbert, D.; Baumbach, T.; Ponti, S.; Pietsch, U.; Leprince, L.; Schneck, J.; Talneau, A.
Journal Article
1999Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high-resolution X-Ray diffraction and grazing incidence diffraction
Zhuang, Y.; Lübbert, D.; Pietsch, U.; Darowski, N.; Bauer, G.
Journal Article
1998Grazing incidence diffraction by epitaxial multilayered gratings
Baumbach, T.; Lübbert, D.; Pietsch, U.; Darowski, N.; Leprince, L.; Talneau, A.; Schneck, J.
Journal Article
1998In-plane strain and strain relaxation in laterally patterned periodic arrays of protect (Si/SiGe) quantum wires and dot arrays
Darowski, N.; Pietsch, U.; Zhuang, Y.; Zerlauth, S.; Bauer, G.; Lübbert, D.; Baumbach, T.
Journal Article
1998Structural characterisation of (GaAs) surface wire structure by triple axis (X-ray) grazing incidence diffraction
Darowski, N.; Paschke, K.; Pietsch, U.; Wang, K.; Baumbach, G.; Forchel, A.; Lübbert, D.; Baumbach, T.
Journal Article