Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2005Active area of GaAs pad detector tested by X-ray beam
Perdochová, A.; Melov, V.G.; Besse, I.; Dubecky, F.; Necas, V.; Haupt, L.
Conference Paper
2005Zerstörungsfreie Prüfverfahren für die Elektronik, mikrobearbeitete Strukturen und Baugruppen
Köhler, B.; Schreiber, J.; Bendjus, B.; Herms, M.; Melov, V.G.; Krüger, P.; Meyendorf, N.
Journal Article
2003Qualitative new mechanical properties of microstructured metallic systems
Schreiber, J.; Melov, V.G.
Conference Paper
20003D-Analyse von Eigenspannungen in einkristallinen Halbleiterwafern mittels Infrarot-Raster-Polariskopie und hochaufgelöster Röntgenbeugung
Herms, M.; Melov, V.G.; Schreiber, J.; Fukuzawa, M.; Yamada, M.
Conference Paper
2000Breakdown of Elasticity in Copper and Aluminium Interconnects
Schreiber, J.; Melov, V.G.; Herms, M.
Conference Paper
2000Residual strain in annealed GaAs single crystal wafers measured by scanning infrared polariscopy and x-ray diffraction
Herms, M.; Fukuzawa, M.; Melov, V.G.; Schreiber, J.; Yamada, M.
Conference Paper
2000Residual strain in annealed GaAs single crystal wafers measured by scanning infrared polariscopy and x-ray diffraction and topography
Herms, M.; Fukuzawa, M.; Melov, V.G.; Schreiber, J.; Möck, P.; Yamada, M.
Journal Article
2000Studies on phase transformations of Cu-phthalocyanine thin films
Berger, O.; Fischer, W.-J.; Adolphi, B.; Tierbach, S.; Melov, V.G.; Schreiber, J.
Journal Article
1999Characterization of GaAs(1-x) Bi(x) Epilayers by Raman Scattering and X-ray Diffraction
Herms, M.; Melov, V.G.; Verma, P.; Irmer, G.; Okamoto, H.; Fukuzawa, M.; Oe, K.; Yamada, M.
Conference Paper
1997Innere Spannungen und Relaxionseffekte in metallischen Leitbahnen mikroelektronischer Bauelemente
Schreiber, J.; Köhler, B.; Meissner, O.; Melov, V.G.
Conference Paper
1997Investigations of relaxation effects in Cu-lines on Si-substrates
Köhler, B.; Meissner, O.; Melov, V.G.; Schreiber, J.
Conference Paper