Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2009Moderne 2-D und 3-D abbildende Röntgenverfahren mit Synchrotronstrahlung
Baumbach, T.; Santos Rolo, T. dos; Ershov, A.; Helfen, L.; Lübbert, D.; Modregger, P.; Pelliccia, D.; Vagovic, P.; Xu, F.
Journal Article
2006Crystallite misorientation analysis in semiconductor wafers and ELO samples by rocking curve imaging
Mikulik, P.; Lübbert, D.; Pernot, P.; Helfen, L.; Baumbach, T.
Conference Paper, Journal Article
2005Distribution and Burgers vectors of dislocations in semiconductor wafers investigated by rocking-curve imaging
Lübbert, D.; Ferrari, C.; Mikulik, P.; Pernot, P.; Helfen, L.; Verdi, N.; Korytar, D.; Baumbach, T.
Journal Article
2005Local wing tilt analysis of laterally overgrown GaN by x-ray rocking curve imaging
Lübbert, D.; Baumbach, T.; Mikulik, P.; Pernot, P.; Helfen, L.; Köhler, R.; Katona, T.M.; Keller, S.; DenBaars, S.P.
Journal Article
2002Dislocation strain field in ultrathin bonded silicon wafers studied by grazing incidence x-ray diffraction
Eymery, J.; Buttard, D.; Fournel, F.; Moriceau, H.; Baumbach, G.T.; Lübbert, D.
Journal Article
2001Observation of dislocation generation in highly strained quantum well lasers during operation
Mazuelas, A.; Dotor, M.L.; Golmayo, D.; Zeimer, U.; Baumbach, T.; Luebbert, D.; Grenzer, J.; Baruchel, J.
Journal Article
2001Strain and temperature distribution in broad-area high-power laser diodes under operation determined by high resolution x-ray diffraction and topography
Zeimer, U.; Grenzer, J.; Baumbach, T.; Lübbert, D.; Mazuelas, A.; Erbert, G.
Journal Article
2001Structure of superconducting (BaCuOx)2/(CaCuO2)n superlattices on SrTiO3(001) investigated by x-ray scattering
Aruta, C.; Zegenhagen, J.; Cowie, B.; Balestrino, G.; Pasquini, G.; Medaglia, P.G.; Ricci, F.; Luebbert, D.; Baumach, T.; Riedo, E.; Ortega, L.; Kramer, R.; Albrecht, J.
Journal Article
2000Grazing incidence x-ray studies of twist-bonded Si/Si and Si/SiO2 interfaces
Buttard, D.; Eymery, J.; Rieutord, F.; Fournel, F.; Lübbert, D.; Baumbach, T.; Moriceau, H.
Journal Article
2000High resolution quality inspection for microelectronics and packaging by X-ray scattering and imaging techniques using synchrotron radiation
Baumbach, T.; Hönig, V.; Helfen, L.; Lübbert, D.
Conference Paper
2000Holographische Tomographie und mikrometeraufgelöste Diffraktometrie
Baumbach, T.; Lübbert, D.; Helfen, L.; Ludwig, W.; Baruchel, J.
Conference Paper
2000Mu-m-resolved high resolution x-ray diffraction imaging for semiconductor quality control
Lübbert, D.; Baumbach, T.; Härtwig, J.; Boller, E.; Pernot, E.
Journal Article
2000Strain and Shape Analysis of Multilayer Surface Gratings by Coplanar and by Grazing-Incidence X-Ray Diffraction
Baumbach, T.; Lübbert, D.; Gailhanou, M.
Journal Article
2000Strain Relaxation in Surface Nano-Structures Studied by X-Ray Diffraction Methods
Baumbach, T.; Lübbert, D.; Gailhanou, M.
Journal Article
2000Strain-driven transition from stepped interfaces to regularly spaced macrosteps in (GaIn)As/Ga(PAs) symmetrically strained superlattices
Giannini, C.; Baumbach, T.; Lübbert, D.; Felici, R.; Tapfer, L.; Marschner, T.; Stolz, W.; Jin-Phillipp, N.Y.; Phillipp, F.
Journal Article
1999Elastic Stress Relaxation in GaInAsP Quantum Wires on InP
Baumbach, T.; Lübbert, D.; Mazuelas, A.; Paris, G.; Jenichen, B.; Kojima, T.; Arai, S.
Journal Article
1999Grazing Incidence Diffraction by Laterally Patterned Semiconductor Nanostructures
Baumbach, T.; Lübbert, D.
Journal Article
1999In Situ Characterization of Strain Distribution in Broad-Area High-Power Lasers under Operation by High-Resolution X-Ray Diffraction and Topography Using Synchrotron Radiation
Zeimer, U.; Baumbach, T.; Grenzer, J.; Lübbert, D.; Pietsch, U.; Mazuelas, A.; Erbert, G.
Journal Article
1999Investigation of Strain Induced Patterning in Superlattices by Grazing incidence Diffraction - Comparison of Morphological and Strain Ordering
Baumbach, G.; Giannini, C.; Lübbert, D.; Felici, R.; Tapfer, L.; Marschner, T.; Stolz, W.
Journal Article
1999Lateral Arrangement of Self-Assembled Quantum dots in an SiGe/Si Superlattice
Bauer, G.; Darowski, N.; Holy, V.; Lübbert, D.; Pietsch, U.; Zerlauth, S.; Stangl, J.
Journal Article
1999Strain investigation of low strained buried gratings by grazing incidence X-Ray diffraction and elasticity theory
Lübbert, D.; Baumbach, T.; Ponti, S.; Pietsch, U.; Leprince, L.; Schneck, J.; Talneau, A.
Journal Article
1999Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high-resolution X-Ray diffraction and grazing incidence diffraction
Zhuang, Y.; Lübbert, D.; Pietsch, U.; Darowski, N.; Bauer, G.
Journal Article
1999Strain Relaxation in Surface Nano-Structures Studied by X-Ray Diffraction Methods
Baumbach, T.; Lübbert, D.; Gailhanou, M.
Journal Article
1999X-Ray Structure Investigation of Lateral Surface Nanostructures - A Full Quantitative analysis of Non-Uniform Lattice Strain
Baumbach, T.; Lübbert, D.; Gailhanou, M.
Journal Article
1998Grazing incidence diffraction by epitaxial multilayered gratings
Baumbach, T.; Lübbert, D.; Pietsch, U.; Darowski, N.; Leprince, L.; Talneau, A.; Schneck, J.
Journal Article
1998In-plane strain and strain relaxation in laterally patterned periodic arrays of protect (Si/SiGe) quantum wires and dot arrays
Darowski, N.; Pietsch, U.; Zhuang, Y.; Zerlauth, S.; Bauer, G.; Lübbert, D.; Baumbach, T.
Journal Article
1998Residual strain in buried and non-buried semiconductor nanostructures
Lübbert, D.; Baumbach, T.; Leprince, L.; Schneck, J.; Talneau, A.; Felici, R.
Book Article
1998Strain-induced patterning in superlattices. Comparison of morphological ordering and strain ordering
Baumbach, T.; Giannini, C.; Lübbert, D.; Felici, R.; Tapfer, L.; Marschner, T.; Stolz, W.
Book Article
1998Structural characterisation of (GaAs) surface wire structure by triple axis (X-ray) grazing incidence diffraction
Darowski, N.; Paschke, K.; Pietsch, U.; Wang, K.; Baumbach, G.; Forchel, A.; Lübbert, D.; Baumbach, T.
Journal Article