| | |
|---|
| 2014 | Anti-counterfeiting technique in the micro region for micro and nano systems
Luczak, F.; Dost, M.; Seiler, B.; Winkler, T.; Michel, B. | Book Article |
| 2009 | The application of energy dispersive diffraction for nondestructive analysis of large material depths and for residual stress determination
Kämpfe, B.; Luczak, F.; Urban, M. | Conference Paper, Journal Article |
| 2008 | Approaches of local stress measurement on microsystem devices
Vogel, D.; Auerswald, E.; Gollhardt, A.; Luczak, F.; Sabate, N.; Michel, B. | Conference Paper |
| 2008 | Residual stress measurements of high spatial resolution
Vogel, D.; Luczak, F.; Michel, B. | Conference Paper |
| 2008 | Residual Stress Measurements on Semiconductor Layers Utilizing Stress Relief Techniques
Vogel, D.; Lehr, M.U.; Grillberger, M.; Jaschke, V.; Geisler, H.; Gollhardt, A.; Luczak, F.; Michel, B. | Conference Paper |
| 2007 | Evaluation of Diffraction Patterns in High Energy X-Ray Analysis
Luczak, F.; Kämpfe, B.; Urban, M. | Conference Paper |
| 2007 | Röntgenoptiken aus mikrostrukturiertem Silizium
Zschenderlein, U.; Frühauf, J.; Straube, H.; Gärtner, E.; Kämpfe, B.; Luczak, F.; Zimny, F.; Petrick, H.; Böhme, H. | Conference Paper |
| 2007 | X-Ray Optics Manufactured by Microtechnology for ED XRD Systems
Zschenderlein, U.; Frühauf, J.; Straube, H.; Gärtner, E.; Kämpfe, B.; Luczak, F.; Zimny, F.; Petrick, H.; Böhme, H. | Conference Paper |
| 2006 | Energy dispersive X-ray diffraction
Kämpfe, B.; Luczak, F.; Michel, B. | Journal Article |
| 2004 | Zuverlässigkeitsbewertung elektronischer Baugruppen mit modernen Mikro- und Nanomesstechniken in Kopplung zur Simulation
Michel, B.; Dudek, R.; Keller, J.; Luczak, F. | Conference Paper |
| 2002 | A modular fluidic demonstrator for the Match-X framework
Schindler-Saefkow, F.; Amiri Jam, K.; Luczak, F.; Großer, V.; Michel, B.; Günther, G. | Conference Paper |
| 2002 | Schulungsunterlagen zur Vermittlung der Grundlagen und anwendungsbezogenen Informationen des mikrotechnischen Baukastensystems
Schünemann, M.; Schüle, A.; Jam, A.K.; Luczak, F. | Report |
| 2000 | Measurement of material properties by a modified microDAC approach
Vogel, D.; Luczak, F.; Wittler, O.; Gollhardt, A.; Walter, H.; Michel, B. | Conference Paper |
| 1999 | MicroDAC deformation analysis on solder interconnects for flip chip
Vogel, D.; Luczak, F.; Schubert, A.; Michel, B. | Conference Paper |