Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2019An experimental study on HCI under various stress conditions
Lange, André; Weddeler, Nicki; Wagner, Jakob; Bogacz, Steffen; Drehsig, Daniel
Presentation
2019Langlebige Prozessoren
Lange, André
Journal Article
2019Toward consistent circuit-level aging simulations in different EDA environments
Velarde Gonzalez, Fabio A.; Giering, Kay-Uwe; Lange, André; Lahbib, Insaf; Crocoll, Sonja
Conference Paper
2018Aging Models: The Basis for Predicting Circuit Reliability
Lange, André
Electronic Publication
2018Analysis of 28 nm SRAM cell stability under mechanical load applied by nanoindentation
Clausner, André; Schlipf, Simon; Kurz, G.; Otto, M.; Paul, J.; Giering, Kay-Uwe; Warmuth, Jens; Lange, André; Jancke, Roland; Aal, A.; Rosenkranz, Rüdiger; Gall, Martin; Zschech, Ehrenfried
Conference Paper
2018NBTI and HCI models for circuit level aging simulations in different EDA environments
Velarde Gonzalez, Fabio Alberto; Lange, André; Crocoll, Sonja; Jancke, Roland
Presentation
2018Prediction of SRAM reliability under mechanical stress induced by harsh environments
Warmuth, Jens; Giering, Kay-Uwe; Lange, André; Clausner, André; Schlipf, Simon; Kurz, Gottfried; Otto, Michael; Paul, Jens; Jancke, Roland; Aal, Andreas; Gall, Martin; Zschech, Ehrenfried
Conference Paper
2017Circuit level aging simulations predict the long-therm behavior of ICS
Lange, André
Report
2017Gezielte Alterungssimulation von Hochvolt-Transistoren
Lange, André
Journal Article
2016BTI variability of SRAM cells under periodically changing stress profiles
Giering, Kay-Uwe; Lange, André; Kaczer, Ben; Jancke, Roland
Conference Paper
2016Multivariate modeling of variability supporting non-gaussian and correlated parameters
Lange, André; Sohrmann, Christoph; Jancke, Roland; Haase, Joachim; Cheng, Binjie; Asenov, Asen; Schlichtmann, Ulf
Journal Article
2016Non-gaussian correlated multivariate modeling for variability abstraction in integrated circuit analysis
Lange, André
: Schlichtmann, Ulf; Barke, Erich
Dissertation
2015Correlated noise description using HDLs
Haase, Joachim; Lange, André
Conference Paper
2015Hybrid dynamical systems for memristor modelling
Haase, Joachim; Lange, André
Conference Paper
2015Towards probabilistic analog behavioral modeling
Lange, André; Harasymiv, Ihor; Eisenberger, Oliver; Roger, Frédéric; Haase, Joachim; Minixhofer, Rainer
Conference Paper
2014Ein universeller Ansatz zur Beschreibung von Prozessvariationen mit beliebig verteilten Modellparametern
Lange, André; Haase, Joachim; Dietrich, Manfred; Kolodinski, Sabine
Conference Paper
2014Variability-aware compact model strategy for 20-nm bulk MOSFETs
Wang, Xingsheng; Reid, Dave; Wang, Liping; Burenkov, Alex; Millar, Campbell; Cheng, Binjie; Lange, Andre; Lorenz, Jürgen; Bär, Eberhard; Asenov, Asen
Conference Paper
2013CHRONOS: Ein Werkzeug zur Berücksichtigung von Alterungseffekten in Schaltungssimulationen
Müller, Leif; Lange, André; Sohrmann, Christoph; Jancke, Roland
Conference Paper
2013The DECO framework: Reliability simulation based on a general design environment communication approach
Sohrmann, Christoph; Lange, André; Jancke, Roland; Müller, Leif
Conference Paper
2013Herausforderungen und Lösungsansätze für die Berücksichtigung des Alterungsverhaltens beim Entwurf integrierter Schaltungen
Jancke, Roland; Lange, André; Müller, Leif; Sohrmann, Christoph
Conference Paper
2013Hybrid dynamical systems for memristor modelling
Haase, Joachim; Lange, André
Conference Paper
2013Probabilistic standard cell modeling considering non-gaussian parameters and correlations
Lange, André; Jancke, Roland; Haase, Joachim; Lorenz, Ingolf; Schlichtmann, Ulf
Conference Paper
2012Generation of random parameters of behavioral models
Lange, André; Haase, Joachim; Sohrmann, Christoph; Jancke, Roland
Conference Paper
2012Methods of parameter variations
Knoth, Christoph; Schlichtmann, Ulf; Li, Bing; Zhang, Min; Olbrich, Markus; Acar, Emrah; Eichler, Uwe; Haase, Joachim; Lange, André; Pronath, Michael
Book Article
2012Path-based statistical gate-level analyses considering timing and energy
Lange, André; Hopsch, Fabian; Haase, Joachim
Conference Paper