Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2020The Crystal Growth Explorer: Real-Time Navigable 3D Visualization of Silicon Grains and Defect Related Data in Cast-Mono and Multicrystalline Bricks
Schönauer, J.; Demant, M.; Trötschler, T.; Kovvali, A.S.; Schremmer, H.; Krenckel, P.; Riepe, S.; Rein, S.
Conference Paper
2020Early Stage Quality Assesment in Silicon Ingots from MDP Brick Characterization
Kovvali, A.S.; Demant, M.; Rebba, B.; Schüler, N.; Haunschild, J.; Rein, S.
Conference Paper
2020Machine Learning for Advanced Solar Cell Production. Adversarial Denoising, Sub-pixel Alignment and the Digital Twin
Demant, M.; Kurumundayil, L.; Kunze, P.; Woernhoer, A.; Kovvali, A.; Rein, S.
Presentation
2020Verfahren zur Verarbeitung von Abbildungen von Halbleiterstrukturen, sowie zur Prozesscharakterisierung und Prozessoptimierung mittels semantischer Datenkompression
Demant, Matthias; Rein, Stefan; Kovvali, Aditya Sai; Greulich, Johannes; Wöhrle, Nico
Patent
2019Learning Quality Rating of As-Cut mc-Si Wafers via Convolutional Regression Networks
Demant, M.; Virtue, P.; Kovvali, A.; Yu, S.X.; Rein, S.
Journal Article
2019Visualizing Material Quality and Similarity of mc-Si Wafers Learned by Convolutional Regression Networks
Demant, M.; Virtue, P.; Kovvali, A.; Yu, S.X.; Rein, S.
Journal Article
2018About the Relevance of Defect Features in As-Cut Multicrystalline Silicon Wafers on Solar Cell Performance
Kovvali, A.; Demant, M.; Trötschler, T.; Haunschild, J.; Rein, S.
Conference Paper
2018Deep Learning Approach to Inline Quality Rating and Mapping of Multi-Crystalline Si-Wafers
Demant, M.; Virtue, P.; Kovvali, A.S.; Yu, S.X.; Rein, S.
Conference Paper