Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2019Spatially resolved cross-linking characterization by imaging low-coherence interferometry
Taudt, Christopher; Nelsen, Bryan; Rossegger, Elisabeth; Schlögl, Sandra; Koch, Edmund; Hartmann, Peter
Journal Article
2019Thin-film characterization with a dual-channel dispersion-encoded imaging low-coherence interferometry approach
Taudt, Christopher; Preuß, Marco; Nelsen, Bryan; Baselt, Tobias; Koch, Edmund; Hartmann, Peter
Conference Paper
2018Fast cross-linking-characterization of waveguide-polymers on wafers by imaging low-coherence interferometry
Taudt, Christopher; Nelsen, Bryan; Schlögl, Sandra; Koch, Edmund; Hartmann, Peter
Journal Article, Conference Paper
2017Characterization of edge effects in precision low-coherence interferometry using broadband light sources
Taudt, Christopher; Baselt, Tobias; Nelsen, Bryan L.; Aßmann, Heiko; Greiner, Andreas; Koch, Edmund; Hartmann, Peter
Conference Paper
2017Evaluation of the thermal stability of a low-coherence interferometer for precision surface profilometry
Taudt, Christopher; Baselt, Tobias; Nelsen, Bryan; Hartmann, Paul; Aßmann, Heiko; Greiner, Andreas; Koch, Edmund
Conference Paper
2016High-resolution material and surface topography characterization by a modified low-coherence interferometer
Taudt, Christopher; Baselt, Tobias; Koch, Edmund; Hartmann, Peter
Poster
2016Measurement of surface topographies in the nm-range for power chip technologies by a modified low-coherence interferometer
Taudt, Christopher; Baselt, Tobias; Nelsen, Bryan L.; Aßmann, Heiko; Greiner, Andreas; Koch, Edmund; Hartmann, Paul
Conference Paper
2016Two-dimensional low-coherence interferometry for the characterization of nanometer-wafer-topographies
Taudt, Christopher; Baselt, Tobias; Nelsen, Bryan; Aßmann, Heiko; Greiner, Andreas; Koch, Edmund; Hartmann, Peter
Conference Paper
2015Cross-linking characterization of polymers based on their optical dispersion utilizing a white-light interferometer
Taudt, Christopher; Baselt, Tobias; Oreski, Gernot; Hirschl, Christina; Koch, Edmund; Hartmann, Peter
Conference Paper
2015High-resolution material and surface topography characterization by a modified low-coherence interferometer
Taudt, Christopher; Baselt, Tobias; Nelsen, Bryan; Koch, Edmund; Hartmann, Peter
Poster