Fraunhofer-Gesellschaft

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Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
1993Comparison of lifetime measurements from the Zerbst and the dispersion techniques.
Klausmann, E.; Fahrner, W.R.; Löffler, S.; Neitzert, H.C.
Journal Article
1991Negative-U, off-center OAs in GaAs and its relation to the EL3 level
Klausmann, E.; Schneider, J.; Kaufmann, U.; Alt, H.C.
Journal Article
1989The electronic states of the Si-SiO2 interface.
Klausmann, E.; Fahrner, W.R.; Bräunig, D.
Book Article
1989The intrinsic states and fixed charges of the Si-SiO2 interface.
Klausmann, E.; Fahrner, W.R.; Bräunig, D.
Book Article
1988Electrical characterization of buried layers in silicon.
Klausmann, E.; Fahrner, W.R.
Journal Article
1985The investigation of mos interface properties by capacitance methods
Klausmann, E.
Book Article
1984Effects of heavy metal contamination from corrosive gas and dopant handling equipment in silicon wafer processing
Klausmann, E.; Eisele, K.M.
Journal Article
1965Spektrometermethoden zur Messung der komplexen Dielkektrizitätskonstanten im Mikrowellengebiet
Klausmann, E.
Dissertation