Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2017Investigation of the refractive index repeatability for tantalum pentoxide coatings, prepared by physical vapor film deposition techniques
Stenzel, O.; Wilbrandt, S.; Wolf, J.; Schürmann, M.; Kaiser, N.; Ristau, D.; Ehlers, H.; Carstens, F.; Schippel, S.; Mechold, L.; Rauhut, R.; Kennedy, M.; Bischoff, M.; Nowitzki, T.; Zöller, A.; Hagedorn, H.; Reus, H.; Hegemann, T.; Starke, K.; Harhausen, J.; Foest, R.; Schumacher, J.
Journal Article
2016Investigation of the refractive index reproducibility for tantalum pentoxide coatings, prepared by PVD techniques
Stenzel, O.; Wilbrandt, S.; Schürmann, M.; Kaiser, N.; Wolf, J.; Ristau, D.; Ehlers, H.; Carstens, F.; Schippel, S.; Mechold, L.; Rauhut, R.; Kennedy, M.; Bischoff, M.; Nowitzki, T.; Zöller, A.; Hagedorn, H.; Reus, H.; Hegemann, T.; Starke, K.; Harhausen, J.; Foest, R.; Schumacher, J.
Conference Paper
2008Luminescent solar concentrators - A review of recent results
Sark, W.G. van; Barnham, K.W.; Slooff, L.H.; Chatten,A.J.; Büchtemann, A.; Meyer, A.; Mc Cormack, S.J.; Koole, J.; Farrell, D.J.; Bose, R.; Bende, E.E.; Burgers, A.R.; Budel, T.; Quilitz, J.; Kennedy, M.; Meyer, T.; Wadman, S.H.; Klink, G.P. van; Koten, G. van; Meijerink, A.; Vanmaekelbergh, D.
Journal Article
2004Ion-assisted deposition processes: Industrial network IntIon
Ehlers, H.; Becker, K.-J.; Beckmann, R.; Beermann, N.; Brauneck, U.; Fuhrberg, P.; Gäbler, D.; Jakobs, S.; Kaiser, N.; Kennedy, M.; König, F.; Laux, S.; Müller, J.C.; Rau, B.; Riggers, W.; Ristau, D.; Schäfer, D.; Stenzel, O.
Conference Paper
2001Combining functional and parametric tests for the example of a digital to analog converter
Wegener, C.; Kennedy, M.-P.; Müller, B.; Straube, B.
Conference Paper
2001Process deviations and spot defects: Two aspects of test and test development for mixed-signal circuits
Wegener, C.; Kennedy, M.P.; Straube, B.
Journal Article
1999Ion-assisted deposition of oxide materials at room temperature by use of different ion sources
Niederwald, H.S.; Laux, S.; Kennedy, M.; Schallenberg, U.; Duparre, A.; Kaiser, N.; Ristau, D.
Journal Article
1997IAD of oxide coatings at low temperature: a comparison of processes based on different ion sources
Niederwald, H.S.; Kaiser, N.; Schallenberg, U.B.; Duparre, A.; Ristau, D.; Kennedy, M.
Conference Paper