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| 2013 | Metal fluoride-based transparent nanocomposites with low refractive indices
Noack, J.; Fritz, C.; Flügel, C.; Hemmann, F.; Gläsel, H.J.; Kahle, O.; Dreyer, C.; Bauer, M.; Kemnitz, E. | Journal Article |
| 2010 | The Ca-test revisited
Kahle, O.; Bauer, M. | Book Article |
| 2009 | The calcium-test - some new insights concerning the measured permeation values
Kahle, O.; Bauer, M. | Conference Paper |
| 2009 | Influence of conversion on fracture behaviour and thermophysical properties of model networks and some aspects of toughening thermosetting resins
Uhlig, C.; Bauer, J.; Bauer, M.; Kahle, O. | Conference Paper |
| 2009 | Optical Crack Tracing (OCT) - an efficient tool both for elastic and elastic-plastic fracture mechanical testing
Uhlig, C.; Kahle, O.; Bauer, M.; Keller, J. | Conference Paper |
| 2008 | High performance composites using nanotechnology
Bauer, M.; Kahle, O.; Landeck, S.; Uhlig, C.; Wurzel, R. | Conference Paper |
| 2007 | Thermophysical characterisation of sub-µm polymer layers by nano-TMA/TGA/DVS
Kahle, O.; Uhlig, C.; Bauer, M. | Conference Paper |
| 2007 | Von der Ellipsometrie zur Nano-TMA/TGA/DVS: Methode und Anwendungen
Kahle, O.; Bauer, M. | Journal Article |
| 2005 | Material development for integrated optics, microelectronics and display technology - selected examples
Dreyer, C.; Schneider, J.; Keil, N.; Zawadzki, C.; Yao, H.H.; Schuldt, U.; Schulze, K.; Kahle, O.; Schulz, S.E.; Uhlig, M.; Uhlig, C.; Boeffel, C.; Gessner, T.; Bauer, M. | Conference Paper |
| 2005 | Novel low-k polycyanurates for integrated circuit (IC) metallization
Schulze, K.; Schuldt, U.; Kahle, O.; Schulz, S.E.; Uhlig, M.; Uhlig, C.; Dreyer, C.; Bauer, M.; Gessner, T. | Conference Paper, Journal Article |
| 2005 | Toughening of reactive resins by phase separation and by particles and measuring fracture toughness by optical crack tracing
Uhlig, C.; Bauer, M.; Kahle, O. | Conference Paper, Journal Article |
| 2004 | NanoTMA/TGA/DVS - beschleunigte Untersuchung von Alterungs- und Sorptionsprozessen bei Realtemperaturen
Bauer, M.; Kahle, O.; Uhlig, C. | Conference Paper |
| 2004 | Verfahren und Vorrichtung zur Bestimmung zumindest eines bruchmechanischen Materialparameters eines Pruefkoerpers
Uhlig, C.; Bauer, M.; Kahle, O.; Vogel, D.; Wieneke, B. | Patent |
| 2001 | VTE - A new method for the characterisation of thin film thermophysical properties
Kahle, O.; Uhlig, C.; Bauer, M. | Conference Paper |
| 2000 | Application of variable-temperature ellipsometry to plasma polymers: The effect of addition of 1,7-octadiene to plasma deposits of acrylic-acid
Haddow, D.B.; Goruppa, A.; Whittle, J.; Short, R.D.; Kahle, O.; Uhlig, C.; Bauer, M. | Journal Article |
| 2000 | Optical crack tracing - a new method for the automatic determination of fracture toughness of polymers
Uhlig, C.; Kahle, O.; Wieneke, B.; Bauer, M. | Journal Article |
| 2000 | Optical crack tracing - A new method for the automatic determination of fracture toughness for crack initiation and propagation
Uhlig, C.; Kahle, O.; Wieneke, B.; Bauer, M. | Conference Paper |
| 2000 | A simple but powerful optical technique for monitoring crack propagation during fracture mechanical tests of polymers
Uhlig, C.; Bauer, M.; Kahle, O.; Wieneke, B. | Conference Paper |
| 1999 | T-Ellipsometry - a new method for characterization of thin film properties
Kahle, O.; Uhlig, C.; Bauer, M. | Conference Paper |
| 1999 | T-Ellipsometry - a new method for the characterization of thin film thermophysical properties
Kahle, O.; Uhlig, C.; Bauer, M. | Book Article |
| 1998 | Glass transition temperature and thermal expansion behaviour of polymer films investigated by variable temperature spectroscopic ellipsometry
Kahle, O.; Wielsch, U.; Metzner, H.; Bauer, J.; Uhlig, C.; Zawatzki, C. | Conference Paper |
| 1997 | The application of thermophysical methods in microsystems and microelectronics
Uhlig, C.; Kahle, O.; Vogel, D.; Bauer, M. | Conference Paper |