Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2019Zerstörungsfreie Schichtdickenmessung an Nassfilmen
Klier, Jens; Weber, Stefan; Molter, Daniel; Freymann, Georg von; Jonuscheit, Joachim
Journal Article
2018Interferometry-aided terahertz time-domain spectroscopy for robust measurements in reflection
Molter, Daniel; Weber, Stefan; Pfeiffer, Tobias; Klier, Jens; Bachtler, Sebastian; Ellrich, Frank; Jonuscheit, Joachim; Freymann, Georg von
Conference Paper
2018Leitfaden zur Bildverarbeitung in der zerstörungsfreien Prüfung
Aderhold, Jochen; Beran, Philip; Ernst, Jürgen; Getto, Sascha; Goetz, Jürgen; Hanke, Randolf; Hartrumpf, Matthias; Heinrich, Matthias; Hildenbrand, Markus; Hiller, Karl-Heinz; Jonuscheit, Joachim; Jungmann, Christian; König, Niels; Koster, Dirk; Krause, Julius; Lugin, Sergey; Meinlschmidt, Peter; Meyer, Johannes; Movahed, Ali; Mörchel, Philipp; Negara, Christian; Nüßler, Dirk; Oswald, Jan; Rabe, Ute; Rick, Rainer; Salamon, Michael; Schöberl, Michael; Henning, Schulte; Spies, Martin; Szielasko, Klaus; Tschuncky, Ralf; Valeske, Bernd; Waschkies, Thomas
: Sackewitz, Michael
Book
2018SelfPaint - a self-programming paint booth
Edelvik, F.; Tiedje, O.; Jonuscheit, J.; Carlson, J.S.
Journal Article, Conference Paper
2018Terahertz radome inspection
Friederich, F.; May, K.H.; Bacchouche, B.; Matheis, C.; Jonuscheit, J.; Moor, M.; Denman, D.; Bramble, J.; Savage, N.
Journal Article
2018Terahertz Techniques in NDE
Jonuscheit, J.
Book Article
2018Terahertz thickness determination with interferometric vibration correction for industrial applications
Pfeiffer, T.; Weber, S.; Klier, J.; Bachtler, S.; Molter, D.; Jonuscheit, J.; Freymann, G. von
Journal Article
2018Volume inspection of composite structures in aircraft radomes with FMCW terahertz radar at 100 and 150 GHz
Bauer, Maris; Keil, Andreas; Matheis, Carsten; Jonuscheit, Joachim; Moor, Michael; Denman, David; Bramble, Jamie; Savage, Nick; Friederich, Fabian
Conference Paper
2018Vorrichtung und Verfahren zum zeitaufgelösten Erfassen gepulster elektromagnetischer Hochfrequenzstrahlung
Jonuscheit, Joachim; Klier, Jens; Molter, Daniel; Freymann, Georg von
Patent
2017Industrial radome inspection with terahertz waves
Friederich, F.; Baccouche, B.; May, K.H.; Matheis, C.; Jonuscheit, J.; Moor, M.; Denman, D.; Bramble, J.; Savage, N.
Conference Paper
2017Interferometry-aided terahertz time-domain spectroscopy
Molter, D.; Trierweiler, M.; Ellrich, F.; Jonuscheit, J.; Freymann, G. von
Journal Article
2017Jede Schicht entscheidet
Klier, J.; Jonuscheit, J.; Freymann, G. von; Weber, S.
Journal Article
2017Nondestructive testing of aeronautics composite structures using ultrawideband radars
Cristofani, E.; Friederich, F.; Vandewal, M.; Jonuscheit, J.
Book Article
2017Thickness determination of wet coatings using self-calibration method
Weber, Stefan; Ellrich, Frank; Paustian, Stephan; Güttler, Nico; Tiedje, Oliver; Jonuscheit, Joachim; Freymann, Georg von
Conference Paper
2017Three-dimensional terahertz imaging with sparse multistatic line arrays
Baccouche, B.; Agostini, P.; Mohammadzadeh, S.; Kahl, M.; Weisenstein, C.; Jonuscheit, J.; Keil, A.; Loeffler, T.; Sauer-Greff, W.; Urbansky, R.
Journal Article
2016Highly accurate thickness measurement of multi-layered automotive paints using terahertz technology
Krimi, Soufiene; Klier, Jens; Jonuscheit, Joachim; Freymann, Georg von; Urbansky, Ralph; Beigang, René
Journal Article
2016Illumination aspects of sparse line arrays for 3D terahertz imaging
Baccouche, Bessem; Mohammadzadeh, Shiva; Keil, Andreas; Kahl, Matthias; Haring Bolivar, Peter; Loeffler, Torsten; Jonuscheit, Joachim; Sauer-Greff, Wolfgang; Urbansky, Ralph; Friederich, Fabian
Conference Paper
2016Interferometry-aided delay lines for high-precision terahertz time-domain spectroscopy
Molter, Daniel; Trierweiler, Manuel; Ellrich, Frank; Jonuscheit, Joachim; Freymann, Georg von
Conference Paper
2016Self-calibrating approach for terahertz thickness measurements of ceramic coatings
Krimi, Soufiene; Klier, Jens; Jonuscheit, Joachim; Freymann, Georg von; Urbansky, Ralph; Beigang, René
Conference Paper
2016Terahertz time-domain technology for thickness determination of industrial relevant multi-layer coatings
Ellrich, Frank; Klier, Jens; Weber, Stefan; Jonuscheit, Joachim; Freymann, Georg von
Conference Paper
2016Terahertz waves for thickness analyses
Jonuscheit, Joachim
Journal Article
2016THz technology - from hype to market
Freymann, Georg von; Jonuscheit, Joachim
Journal Article
2016Verfahren und Vorrichtung zum Bestimmen der Schichtdicken einer mehrschichtigen Probe
Krimi, Soufiene; Klier, Jens; Jonuscheit, Joachim
Patent
2015Berührungslos und zerstörungsfrei - Keramiken charakterisieren mit Terahertz-Wellen
Jonuscheit, Joachim
Journal Article
2015Die Entwicklung der Terahertz-Technik - vom Hype zum Markt
Freymann, Georg von; Jonuscheit, Joachim
Journal Article
2015An evolutionary algorithm based approach to improve the limits of minimum thickness measurements of multilayered automotive paints
Krimi, Soufiene; Klier, Jens; Ellrich, Frank; Jonuscheit, Joachim; Urbansky, R.; Beigang, René; Freymann, Georg von
Conference Paper
2015High resolution terahertz volume inspection using a rectangular dielectric rod antenna in transceiver configuration
Baccouche, Bessem; Baktash, N.; Clemens, J.; Natale, A.; Jonuscheit, Joachim; Friederich, Fabian
Conference Paper
2015Influence of substrate material on radiation characteristics of THz photoconductive emitters
Klier, J.; Torosyan, G.; Schreiner, N.S.; Molter, D.; Ellrich, F.; Zouaghi, W.; Peytavit, E.; Lampin, J.F.; Beigang, R.; Jonuscheit, J.; Freymann, G. von
Journal Article
2015A sparse array based sub-terahertz imaging system for volume inspection
Baccouche, Bessem; Keil, A.; Kahl, M.; Haring Bolivar, P.; Loeffler, T.; Jonuscheit, Joachim; Friederich, Fabian
Conference Paper
2015A sparse multistatic imaging system for terahertz volume inspection
Baccouche, Bessem; Kahl, M.; Keil, A.; Bolivar, P.H.; Loeffler, T.; Jonuscheit, Joachim; Friederich, Fabian
Conference Paper
2015THz-TDS based near-field imaging and spectroscopy at 25 nm length scale
Huth, F.; Molter, D.; Klier, J.; Jonuscheit, J.; Freymann, G. von; Keilmann, F.; Huber, A.J.
Conference Paper
2015Zerstörungsfreie Mehrschichtanalyse
Jonuscheit, Joachim
Journal Article
2014Aeronautics composite material inspection with a terahertz time-domain spectroscopy system
Ospald, F.; Zouaghi, W.; Beigang, R.; Matheis, C.; Jonuscheit, J.; Recur, B.; Guillet, J.-P.; Mounaix, P.; Vleugels, W.; Bosom, P.; Gonzalez, L.; Lopez, I.; Martinez, R.; Sternberg, Y.; Vandewal, M.
Journal Article
2014Continuous wave terahertz inspection of glass fiber reinforced plastics with semi-automatic 3-D image processing for enhanced defect detection
Friederich, F.; Cristofani, E.; Matheis, C.; Jonuscheit, J.; Beigang, R.; Vandewal, M.
Conference Paper
2014Improved substance identification by suppression of multiple-reflection-induced spectral noise
Ellrich, F.; Molter, D.; Krimi, S.; Jonuscheit, J.; Freymann, G. von; Platte, F.; Fredebeul, C.; Nalpantidis, K.; Hübsch, D.; Würschmidt, T.; Sprenger, T.
Conference Paper
2014Multi-step pattern-recognition: A powerful tool for substance identification based on real-world terahertz-spectra
Ellrich, F.; Molter, D.; Jonuscheit, J.; Freymann, G. von; Beigang, R.; Platte, F.; Nalpantidis, K.; Sprenger, T.; Hübsch, D.
Conference Paper
2014Nondestructive testing potential evaluation of a terahertz frequency-modulated continuous-wave imager for composite materials inspection
Cristofani, Edison; Friederich, Fabian; Wohnsiedler, Sabine; Matheis, Carsten; Jonuscheit, Joachim; Vandewal, Marijke; Beigang, René
Journal Article
2014Strukturanalyse mittels Terahertz
Jonuscheit, Joachim
Journal Article
2014Terahertz FMCW inspection of GFRP composites: Comparison with conventional NDT techniques and enhanced defect detection capability through semi-automatic 3-D image processing
Matheis, C.; Wohnsiedler, S.; Ospald, F.; Cristofani, E.; Brook, A.; Jonuscheit, J.; Beigang, R.; Vandewal, M.
Conference Paper
2014Towards 3-D THz volume inspection for process control
Friederich, F.; Baccouche, B.; Keil, A.; Kahl, M.; Bolivar, P.H.; Löffler, T.; Jonuscheit, J.
Conference Paper
2014Zerstörungsfreie Analyse
Jonuscheit, Joachim
Journal Article
2014Zerstörungsfreie Prüfung von Verbundwerkstoffen mit Terahertz-Technik im Vergleich zu etablierten Prüfverfahren
Wohnsiedler, Sabine; Matheis, Carsten; Jonuscheit, Joachim; Beigang, René
Journal Article
2013Applicability of compressive sensing on three-dimensional terahertz imagery for in-depth object defect detection and recognition using a dedicated semisupervised image processing methodology
Brook, A.; Cristofani, E.; Becquaert, M.; Lauwens, B.; Jonuscheit, J.; Vandewal, M.
Journal Article
2013Inline multilayer thickness sensing by using terahertz time-domain spectroscopy in reflection geometry
Krimi, S.; Klier, J.; Herrmann, M.; Jonuscheit, J.; Beigang, R.
Conference Paper
2013Revealing the invisible - identifying concealed substances by means of terahertz spectroscopy
Jonuscheit, Joachim; Molter, Daniel; Ellrich, Frank; Beigang, René; Platte, Frank; Nalpantidis, Konstantinos
Journal Article
2013Structural health monitoring using a scanning THz system
Vandewal, M.; Cristofani, E.; Brook, A.; Vleugels, W.; Ospald, F.; Beigang, R.; Wohnsiedler, S.; Matheis, C.; Jonuscheit, J.; Guillet, J.-P.; Recur, B.; Manek-Hönninger, I.; Mounaix, P.; Venegas, P.; Lopez, I.; Martinez, R.; Sternberg, Y.
Conference Paper
20123-D radar image processing methodology for Non-Destructive Testing of aeronautics composite materials and structures
Brook, A.; Cristofani, Edison; Vandewal, Marijke; Matheis, Carsten; Jonuscheit, Joachim
Conference Paper
2012A 3D THz image processing methodology for a fully integrated, semi-automatic and near real-time operational system
Brook, A.; Cristofani, E.; Vandewal, M.; Matheis, C.; Jonuscheit, J.; Beigang, R.
Conference Paper
2012All-solid-state THz ATR spectroscopy module
Molter, D.; Torosyan, G.; Klier, J.; Matheis, C.; Petermann, C.; Weber, S.; Ellrich, F.; Jonuscheit, J.; Beigang, R.
Conference Paper
2012Berührungslose Mehrlagen-Schichtdickenmessung industrieller Beschichtungen mittels THz-Messtechnik
Feige, V.K.S.; Berta, M.; Ellrich, F.; Jonuscheit, J.; Beigang, R.
Journal Article
2012Chemometric tools for analysing Terahertz fingerprints in a postscanner
Ellrich, Frank; Torosyan, Garik; Wohnsiedler, Sabine; Bachtler, Sebastian; Hachimi, A.; Jonuscheit, Joachim; Beigang, René; Platte, F.; Nalpantidis, K.; Sprenger, T.; Hübsch, D.
Conference Paper
2012Development and optimization of THz NDT on aeronautics composite multilayered structures
Vandewal, M.; Depauw, J.; Rombaut, K.; Beigang, R.; Jonuscheit, J.; Mounaix, P.; Sáez de Ocáriz, I.; Martinez Edo, R.; Priegue, A.; Sternberg, Y.
Conference Paper
2012In the news: THz spectrometer tests substances
Jonuscheit, J.
Journal Article
2012In-depth high-resolution SAR imaging using Omega-k applied to FMCW systems
Cristofani, Edison; Vandewal, Marijke; Matheis, Carsten; Jonuscheit, Joachim
Conference Paper
2012Terahertz-Spektroskopie: Messung von Gasen, Flüssigkeiten und Festkörpern
Molter, D.; Theuer, M.; Jonuscheit, J.; Torosyan, G.; Beigang, R.
Journal Article
2012Unsichtbares sichtbar machen - versteckte Substanzen mittels Terahertz-Spektroskopie identifizieren
Jonuscheit, J.; Molter, D.; Ellrich, F.; Beigang, R.; Platte, F.; Nalpantidis, K.
Journal Article
2011Combless broadband terahertz generation with conventional laser diodes
Molter, D.; Wagner, A.; Weber, S.; Jonuscheit, J.; Beigang, R.
Journal Article
2011Compact fiber-coupled terahertz spectroscopy system pumped at 800 nm wavelength
Ellrich, F.; Weinland, T.; Molter, D.; Jonuscheit, J.; Beigang, R.
Journal Article
2011Far-field THz radiation pattern from photoconductive emitters on different substrates
Klier, J.; Wohnsiedler, S.; Zouaghi, W.; Peytavit, E.; Lampin, J.-F.; Jonuscheit, J.; Beigang, R.
Conference Paper
2011Handheld miniature THz ATR module
Molter, D.; Torosyan, G.; Klier, J.; Matheis, C.; Petermann, C.; Weber, S.; Ellrich, F.; Jonuscheit, J.; Beigang, R.
Conference Paper
2011Non-contact multilayer thickness measurements with reflection-mode terahertz time-domain spectroscopy
Feige, V.; Nix, S.; Ellrich, F.; Jonuscheit, J.; Beigang, R.
Conference Paper
2011Terahertz cross-correlation system with a combless spectrum
Molter, D.; Wagner, A.; Weber, S.; Jonuscheit, J.; Beigang, R.
Conference Paper
2011Terahertz im Aufwärtstrend
Jonuscheit, J.
Journal Article
2011The transverse electromagnetic horn antenna as an efficient THz pulse emitter
Lampin, J.-F.; Peytavit, E.; Akalin, T.; Ducournau, G.; Klier, J.; Wohnsiedler, S.; Jonuscheit, J.; Beigang, R.
Conference Paper
2010Automatically detecting peaks in terahertz time-domain spectroscopy
Stephani, H.; Jonuscheit, J.; Robiné, C.; Heise, B.
Conference Paper
2010CCD-camera-based electro-optical detection of nanosecond THz pulses from an optical parametric oscillator
Meng, F.Z.; Thomson, M.D.; Molter, D.; Löffler, T.; Jonuscheit, J.; Beigang, R.; Bartschke, J.; Bauer, T.; Nittmann, M.; Roskos, H.G.
Conference Paper
2010Coherent electro-optical detection of terahertz radiation from an optical parametric oscillator
Meng, F.Z.; Thomson, M.D.; Molter, D.; Löffler, T.; Jonuscheit, J.; Beigang, R.; Bartschke, J.; Bauer, T.; Nittmann, M.; Roskos, H.G.
Journal Article
2010Multichannel THz imaging using arrays of photoconductive antennas
Wohnsiedler, S.; Kolano, M.; Klier, J.; Herrmann, M.; Jonuscheit, J.; Beigang, R.; Peytavit, E.; Lampin, J.-F.
Conference Paper
2010A pulsed THz imaging system with a line focus and a balanced 1-D detection scheme with two industrial CCD line-scan cameras
Wiegand, C.; Herrmann, M.; Bachtler, S.; Klier, J.; Molter, D.; Jonuscheit, J.; Beigang, R.
Journal Article
2010A pulsed THz imaging system with a line focusanda balanced1-D detection scheme with two industrial CCD line cameras
Wiegand, C.; Herrmann, M.; Bachtler, S.; Molter, D.; Klier, J.; Jonuscheit, J.; Beigang, R.
Conference Paper
2010Terahertz time domain spectroscopy for nondestructive testing and sensing applications
Ellrich, F.; Herrmann, M.; Jonuscheit, J.; Theuer, M.; Torosyan, G.; Molter, D.; Wiegand, S.; Wohnsiedler, S.; Beigang, R.
Conference Paper
2010Terahertz-Wellen - ein neuer Spektralbereich für die industrielle Messtechnik
Ellrich, F.; Klier, J.; Jonuscheit, J.; Weinland, T.; Beigang, R.
Journal Article
2010THz balanced electro-optic detection with two line-scan cameras
Herrmann, M.; Wiegand, C.; Molter, D.; Jonuscheit, J.; Beigang, R.
Conference Paper
2009The influence of surface roughness on THz reflection measurements
Herrmann, M.; Wiegand, C.; Jonuscheit, J.; Beigang, R.
Conference Paper
2009Simulation and experiment of terahertz stand-off detection
Wohnsiedler, S.; Theuer, M.; Herrmann, M.; Islam, S.; Jonuscheit, J.; Beigang, R.; Hase, F.
Conference Paper
2009Terahertz standoff identification under real world conditions
Herrmann, M.; Wiegand, C.; Wohnsiedler, S.; Jonuscheit, J.; Beigang, R.
Conference Paper
2009Terahertz standoff identification: Influence of environment and sample properties
Herrmann, M.; Wohnsiedler, S.; Wiegand, C.; Theuer, M.; Jonuscheit, J.; Beigang, R.
Conference Paper
2009Terahertz-Wellen: Von der Grundlagenforschung zur industriellen Anwendung
Herrmann, M.; Jonuscheit, J.
Abstract
2009Transparente Analyse: Photonische Terahertz-Technologie für Grundlagen und Anwendungen
Jonuscheit, J.; Herrmann, M.; Beigang, R.
Journal Article
2009Verfahren zur Bestimmung einer in einen zu befuellenden Koerper zudosierten Menge eines fliessfaehigen Stoffes
Torosyan, G.; Beigang, R.; Jonuscheit, J.
Patent
2008200 Hz rapid scan fiber-coupled terahertz time domain spectroscopy system
Ellrich, F.; Molter, D.; Weinland, T.; Theuer, M.; Jonuscheit, J.; Beigang, R.
Conference Paper
2008Fasergekoppeltes Terahertz-Spektroskopiesystem
Ellrich, F.; Weinland, T.; Theuer, M.; Jonuscheit, J.; Beigang, R.
Journal Article
2008Influences of real-world conditions on terahertz stand-off detection: Simulation and experiment
Wohnsiedler, S.; Theuer, M.; Herrmann, M.; Islam, S.; Jonuscheit, J.; Beigang, R.; Hase, F.
Conference Paper
2008Terahertz-Bildgebung in industriellen Anwendungen
Theuer, M.; Torosyan, G.; Ellrich, F.; Jonuscheit, J.; Beigang, R.
Journal Article
2008Thin-film measurements with THz-radiation
Ellrich, F.; Theuer, M.; Torosyan, G.; Jonuscheit, J.; Beigang, R.
Conference Paper