Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2017Reliability analysis of LPCVD SiN gate dielectric for AlGaN/GaN MIS-HEMTs
Jauss, S.A.; Hallaceli, K.; Mansfeld, S.; Schwaiger, S.; Daves, W.; Ambacher, O.
Journal Article
2016Poly-silicon CMOS compatible gate module for AlGaN/GaN-on-silicon MIS-HEMTs for power electronics applications
Jauss, S.A.; Schwaiger, S.; Daves, W.; Ambacher, O.
Conference Paper
2016Post drain-stress behavior of AlGaN/GaN-on-Si MIS-HEMTs
Jauss, S.A.; Kilian, S.; Schwaiger, S.; Noll, S.; Daves, W.; Ambacher, O.
Journal Article
2015Charge trapping in gate-drain access region of AlGaN/GaN MIS-HEMTs after drain stress
Jauss, S.A.; Schwaiger, S.; Daves, W.; Noll, S.; Ambacher, O.
Conference Paper