Publica
Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten. | | |
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| 2004 | 157 nm and 193 nm scatter, R and T measurement technique
Gliech, S.; Gessner, H.; Hultaker, A.; Duparre, A. | Conference Paper |
| 2004 | Characterization of CaF2 substrates for VUV fluoride coatings
Hultaker, A.; Gliech, S.; Gessner, H.; Duparre, A. | Conference Paper |
| 2004 | Modeling and characterizing thin film nanostructures for ultrahydrophobic surfaces with controlled optical scatter
Flemming, M.; Hultaker, A.; Reihs, K.; Duparre, A. | Conference Paper |
| 2003 | Characterizing CaF2 for VUV optical components: Roughness, surface scatter, and bulk scatter
Hultaker, A.; Benkert, N.; Gliech, S.; Duparre, A. | Conference Paper |
| 2003 | Electrical and optical properties of thin films consisting of tin-doped indium oxide nanoparticles
Ederth, J.; Johnsson, P.; Niklasson, G.A.; Hoel, A.; Hultaker, A.; Heszler, P.; Granqvist, C.G.; Doorn, A.R. van; Jongerius, M.J.; Burgard, D. | Journal Article |
| 2003 | Methology to evaluate light scatter mechanisms of VUV substrates and coatings
Duparre, A.; Gliech, S.; Hultaker, A. | Book Article |
| 2003 | VUV light scattering measurements of substrates and thin film coatings
Hultaker, A.; Gliech, S.; Benkert, N.; Duparre, A. | Conference Paper |