Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2004157 nm and 193 nm scatter, R and T measurement technique
Gliech, S.; Gessner, H.; Hultaker, A.; Duparre, A.
Conference Paper
2004Characterization of CaF2 substrates for VUV fluoride coatings
Hultaker, A.; Gliech, S.; Gessner, H.; Duparre, A.
Conference Paper
2004Modeling and characterizing thin film nanostructures for ultrahydrophobic surfaces with controlled optical scatter
Flemming, M.; Hultaker, A.; Reihs, K.; Duparre, A.
Conference Paper
2003Characterizing CaF2 for VUV optical components: Roughness, surface scatter, and bulk scatter
Hultaker, A.; Benkert, N.; Gliech, S.; Duparre, A.
Conference Paper
2003Electrical and optical properties of thin films consisting of tin-doped indium oxide nanoparticles
Ederth, J.; Johnsson, P.; Niklasson, G.A.; Hoel, A.; Hultaker, A.; Heszler, P.; Granqvist, C.G.; Doorn, A.R. van; Jongerius, M.J.; Burgard, D.
Journal Article
2003Methology to evaluate light scatter mechanisms of VUV substrates and coatings
Duparre, A.; Gliech, S.; Hultaker, A.
Book Article
2003VUV light scattering measurements of substrates and thin film coatings
Hultaker, A.; Gliech, S.; Benkert, N.; Duparre, A.
Conference Paper