Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2014Defect detection in through silicon vias by GHz scanning acoustic microscopy: Key ultrasonic characteristics
Phommahaxay, A.; Wolf, I. de; Djuric, T.; Hoffrogge, P.; Brand, S.; Czurratis, P.; Philipsen, H.; Beyer, G.; Struyf, H.; Beyne, E.
Conference Paper
2013High frequency scanning acoustic microscopy applied to 3D integrated process: Void detection in through silicon vias
Phommahaxay, A.; Wolf, I. de; Hoffrogge, P.; Brand, S.; Czurratis, P.; Philipsen, H.; Civale, Y.; Vandersmissen, K.; Halder, S.; Beyer, G.; Swinnen, B.; Miller, A.; Beyne, E.
Conference Paper
2012Failure analysis using scanning acoustic microscopy for diagnostics of electronic devices and 3D system integration technologies
Czurratis, P.; Hoffrogge, P.; Brand, S.; Altmann, F.; Petzold, M.
Conference Paper
2011Extending acoustic microscopy for comprehensive failure analysis applications
Brand, S.; Czurratis, P.; Hoffrogge, P.; Temple, D.; Malta, D.; Reed, J.; Petzold, M.
Journal Article
2010Automated inspection and classification of flip-chip-contacts using scanning acoustic microscopy
Brand, S.; Czurratis, P.; Hoffrogge, P.; Petzold, M.
Conference Paper, Journal Article
2010Extending acoustic microscopy for comprehensive failure analysis applications
Brand, S.; Petzold, M.; Czurratis, P.; Hoffrogge, P.
Conference Paper