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| 1999 | Entwicklung von Abformtechniken für metallische Mikrobauteile
Höper, R.; Menz, A.; Benecke, W.; Duong, T.V.; Hartwig, T.; Kunze, H.-D. | Conference Paper |
| 1997 | Adsorption and growth of dip-coating prepolymer films on silicon wafers
Gesang, T.; Höper, R.; Possart, W.; Petermann, J.; Hennemann, O.-D. | Journal Article |
| 1997 | Characterization of vapor phase deposited organic molecules on silicon surfaces
Dieckhoff, S.; Höper, R.; Schlett, V.; Gesang, T.; Possart, W.; Hennemann, O.-D.; Günster, J.; Kempter, V. | Journal Article |
| 1996 | Studies on the interphase of a model adhesive joint
Possart, W.; Fanter, D.; Dieckhoff, S.; Gesang, T.; Hartwig, A.; Höper, R.; Schlett, V.; Hennemann, O.-D. | Journal Article |
| 1995 | AFM - Abbildung feinster Strukturen
Gesang, T.; Höper, R.; Possart, W.; Hennemann, O.-D. | Journal Article |
| 1995 | AFM investigations of the initial stages of prepolymer film growth on aluminium
Gesang, T.; Höper, R.; Dieckhoff, S.; Fanter, D.; Hartwig, A.; Possart, W.; Hennemann, O.-D. | Journal Article |
| 1995 | Analysis of thin cyanurate prepolymer films on solids as a model of the adhesive interphase
Possart, W.; Dieckhoff, S.; Fanter, D.; Gesang, T.; Hartwig, A.; Höper, R.; Schlett, V.; Hennemann, O.-D. | Conference Paper |
| 1995 | Comparative film thickness determination by atomic force microscopy and ellipsometry for ultrathin prepolymer films
Gesang, T.; Fanter, D.; Höper, R.; Possart, W.; Hennemann, O.-D. | Journal Article |
| 1995 | A comparison of scanning force microscopy and ellipsometry for thickness determination of ultrathin polymer films
Gesang, T.; Fanter, D.; Höper, R.; Possart, W.; Hennemann, O.-D. | Conference Paper |
| 1995 | A comparison of scanning force microscopy and ellipsometry for thickness determination of ultrathin polymer films
Gesang, T.; Fanter, D.; Höper, R.; Possart, W.; Hennemann, O.-D. | Conference Paper, Journal Article |
| 1995 | Imaging elastic sample properties with an atomic force microscope operating in the Tapping Mode
Höper, R.; Gesang, T.; Possart, W.; Hennemann, O.-D.; Boseck, S. | Journal Article |
| 1995 | Organic film formation investigated by atomic force microscopy on the nanometer scale
Gesang, T.; Höper, R.; Dieckhoff, S.; Schlett, V.; Possart, W.; Hennemann, O.-D. | Journal Article |
| 1995 | Prepolymer film growth by adsorption out of solution on silicon and aluminium. An atomic force microscope study
Gesang, T.; Höper, R.; Dieckhoff, S.; Hartwig, A.; Possart, W.; Hennemann, O.-D. | Journal Article |
| 1995 | Quantitative Erfassung von Oberflächentopographien
Gesang, T.; Höper, R.; Possart, W.; Hennemann, O.-D. | Journal Article |
| 1994 | Scanning force microscopy of the film formation processes - ultrathin prepolymer films grown on aluminum and silicon out of solution
Gesang, T.; Höper, R.; Hartwig, A.; Possart, W.; Hennemann, O.-D. | Conference Paper, Journal Article |
| 1994 | Single-shell carbon nanotubes imaged by atomic force microscopy.
Höper, R.; Workman, R.K.; Chen, D.; Sarid, D.; Yadav, T.; Withers, J.C.; Loutfy, R.O. | Journal Article |
| 1994 | Ultrathin polymer coatings investigated by atomic force microscopy and ellipsometry
Gesang, T.; Fanter, D.; Höper, R.; Possart, W.; Hennemann, O.-D. | Conference Paper |