Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2018About the Relevance of Defect Features in As-Cut Multicrystalline Silicon Wafers on Solar Cell Performance
Kovvali, A.; Demant, M.; Trötschler, T.; Haunschild, J.; Rein, S.
Conference Paper
2018Building the ENRICH Community - Common European Network as Advantage for ENRICH in Brazil, China and in the USA
Haunschild, Johanna; Orth, Ronald; Pereira Ferreira, Romulo
Conference Paper
2018ENRICH - European Network of Research and Innovation Centres and Hubs
Orth, Ronald; Haunschild, Johanna
Poster
2018ENRICH Community Building - Development of a Decision Support Tool for Membership Selection
Haunschild, Johanna; Kreiling, Laura
Conference Paper
2018Facts & Figures: Get to know Brazil and its innovative Industries
Haunschild, Johanna; Pereira Ferreira, Romulo; Tsog, Sara
Report
2018Facts & Figures: Get to know the European Union and its Innovative Industries
Haunschild, Johanna; Pereira Ferreira, Romulo
Report
2018Fatos & Figuras: Conheça a União Europeia e suas indústrias inovadoras
Haunschild, Johanna; Pereira Ferreira, Romulo
Report
2018Inline Characterization of Diamond Wire Sawn Multicrystalline Silicon Wafers
Haunschild, J.; Bergmann, N.; Hammer, T.; Krieg, K.; Kaden, T.; Anspach, O.; Schremmer, H.; Rein, S.
Conference Paper
2018Inline Wafer Identification Using Optical Character Recognition (OCR)
Al-Hajjawi, S.; Hammer, T.; Haunschild, J.
Conference Paper
2018International Innovation Partnerships by ENRICH in Brazil
Will, Markus; Haunschild, Johanna
Presentation
2017Comparative analysis of German and Brazilian innovation systems to improve binational cooperation
Melo, G.; Haunschild, J.; Orth, R.; Will, M.; Kohl, H.
Conference Paper
2017Comparison of line-wise pl-imaging and area-wise pl-imaging
Höffler, H.; Dost, G.; Brand, A.; Haunschild, J.; Schremmer, H.; Bergmann, A.
Journal Article, Conference Paper
2017Deployment of a business and innovation centre to foster cooperation between Europe and Brazil
Haunschild, Johanna; Melo, Gustavo; Orth, Ronald; Will, Markus; Kohl, Holger
Conference Paper
2017Enhancing international collaboration through regional innovation hubs
Cap, Jan-Patrick; Haunschild, Johanna; Melo, Gustavo; Battistella Luna, Marina
Conference Paper
2017Predicting bulk lifetime values by applying wet chemistry H-termination for inline quality control of silicon wafers
Al-Hajjawi, S.; Haunschild, J.; Zimmer, M.; Dannenberg, T.; Preu, R.
Conference Paper, Journal Article
2017Review of tools and approaches for inline quality control in high efficiency silicon solar cell production
Haunschild, J.; Greulich, J.; Höffler, H.; Wasmer, S.; Emanuel, G.; Krieg, A.; Friedrich, L.; Rein, S.
Conference Paper
2016Experimental proof of the slow light-induced degradation component in compensated n-type silicon
Niewelt, T.; Schön, J.; Broisch, J.; Rein, S.; Haunschild, J.; Warta, W.; Schubert, M.C.
Conference Paper
2016Influence of external contacting on electroluminescence and fill factor measurements
Höffler, H.; Haunschild, J.; Rein, S.
Journal Article
2016Inline quality rating of multi-crystalline wafers based on photoluminescence images
Demant, M.; Rein, S.; Haunschild, J.; Strauch, T.; Höffler, H.; Broisch, J.; Wasmer, S.; Sunder, K.; Anspach, O.; Brox, T.
Journal Article, Conference Paper
2016People are at the focus: Personal KM in an organizational context
Haunschild, Johanna; Schmieg, Hans Georg; Steinhöfel, Erik
Conference Paper
2016Two steps to IT transparency: A practitioner’s approach for a knowledge based analysis of existing IT landscapes in SME
Kohl, Holger; Orth, Ronald; Haunschild, Johanna; Schmieg, Hans Georg
Conference Paper
2015Grain-to-grain contrasts in photoluminescence images of silicon wafers
Höffler, H.; Haunschild, J.; Rein, S.
Journal Article, Conference Paper
2015Investigating the impact of parameter and process variations on multicrystalline PERC cell efficiency
Wasmer, S.; Greulich, J.; Höffler, H.; Haunschild, J.; Demant, M.; Rein, S.
Conference Paper
2015Light-Induced Degradation and Regeneration in n-Type Silicon
Niewelt, T.; Broisch, J.; Schön, J.; Haunschild, J.; Rein, S.; Warta, W.; Schubert, M.C.
Conference Paper, Journal Article
2015A new method for the determination of the dopant-related base resistivity despite the presence of thermal donors
Broisch, J.; Haunschild, J.; Rein, S.
Journal Article
2015Short-circuit current density imaging via PL image evaluation based on implied voltage distribution
Höffler, H.; Breitenstein, O.; Haunschild, J.
Journal Article
2015Verfahren zur Charakterisierung eines Halbleiterwafers
Haunschild, Jonas; Broisch, Juliane; Rein, Stefan
Patent
2014Determination of the dopant-related base resistivity in presence of thermal donors
Broisch, J.; Haunschild, J.; Rein, S.
Conference Paper
2014Interlaboratory study of eddy-current measurement of excess-carrier recombination lifetime
Blum, A.L.; Swirhun, J.S.; Sinton, R.A.; Yan, F.; Herasimenka, S.; Roth, T.; Lauer, K.; Haunschild, J.; Lim, B.; Bothe, K.; Hameiri, Z.; Seipel, B.; Xiong, R.; Dhamrin, M.; Murphy, J.D.
Journal Article
2014Photoluminescence image evaluation of solar cells based on implied voltage distribution
Breitenstein, O.; Höffler, H.; Haunschild, J.
Journal Article
2014Simulation of luminescence intensity combining PC1D electrical simulation with analytical optical models
Höffler, H.; Greulich, J.; Haunschild, J.; Rein, S.
Conference Paper
2014Spatially resolved determination of junction voltage of silicon solar cells
Höffler, H.; Al-Mohtaseb, H.; Wöhrle, N.; Michl, B.; Kasemann, M.; Haunschild, J.
Conference Paper, Journal Article
2014Two image processing tools to analyse alkaline texture and contact finger geometry in microscope images
Strauch, T.; Demant, M.; Lorenz, A.; Haunschild, J.; Rein, S.
Conference Paper
2014UMG N-Type Cz-Silicon: Influencing Factors of the Light-Induced Degradation and Its Suitability for PV Production
Broisch, J.; Schmidt, J.; Haunschild, J.; Rein, S.
Conference Paper
2014Voltage calibration of luminescence images of silicon solar cells
Höffler, H.; Al-Mohtaseb, H.; Haunschild, J.; Michl, B.; Kasemann, M.
Journal Article
2013Comparing lifetime and photoluminescence imaging pattern recognition methodologies for predicting solar cell results based on as-cut wafer properties
Sinton, R.; Haunschild, J.; Demant, M.; Rein, S.
Journal Article
2013Evaluation and improvement of a feature-based classification framework to rate the quality of multicrystalline silicon wafers
Demant, M.; Höffler, H.; Schwaderer, D.; Seidl, A.; Haunschild, J.; Rein, S.
Conference Paper
2013Evaluation of cast mono silicon material for thermal oxide passivated solar cells
Schwab, C.; Haunschild, J.; Graf, M.; Wufka, C.; Wolf, A.; Biro, D.; Preu, R.
Journal Article, Conference Paper
2013Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime
Blum, A.L.; Swirhun, J.S.; Sinton, R.A.; Yan, F.; Herasimenka, S.; Roth, T.; Lauer, K.; Haunschild, J.; Lim, B.; Bothe, K.; Hameiri, Z.; Seipel, B.; Xiong, R.; Dhamrin, M.; Murphy, J.D.
Conference Paper
2012Cz-silicon wafers in solar cell production: Efficiency-limiting defects and material quality control
Haunschild, J.; Broisch, J.; Reis, I.; Rein, S.
Journal Article
2012Lumineszenz-Imaging - Vom Block zum Modul
Haunschild, Jonas
Dissertation
2012A method to detect defective solder joints by Rs-electroluminescence imaging
Walter, J.; Eberlein, D.; Haunschild, J.; Tranitz, M.; Eitner, U.
Journal Article, Conference Paper
2012Modelling of physically relevant features in photoluminescence images
Demant, M.; Greulich, J.; Glatthaar, M.; Haunschild, J.; Rein, S.
Journal Article, Conference Paper
2012Rating and sorting of mc-Si as-cut wafers in solar cell production using PL imaging
Haunschild, J.; Reis, I.E.; Chipei, T.; Demant, M.; Thaidigsmann, B.; Linse, M.; Rein, S.
Journal Article, Conference Paper
2012Relation between solar cell efficiency and crystal defect etching induced by acidic texturization on multicrystalline silicon material
Nievendick, J.; Zimmer, M.; Souren, F.; Haunschild, J.; Rentsch, J.
Journal Article
2012Statistical evaluation of a luminescence-based method for imaging the series resistance of solar cells
Höffler, H.; Haunschild, J.; Zeidler, R.; Rein, S.
Journal Article, Conference Paper
2012Tomographic defect reconstruction of multicrystalline silicon ingots using photoluminescence images of As-Cut wafers and solar cells
Zeidler, R.; Haunschild, J.; Seeber, B.; Riepe, S.; Höffler, H.; Fertig, F.; Reis, I.; Rein, S.
Conference Paper
2011Detecting efficiency-limiting defects in Czochralski-grown silicon wafers in solar cell production using photoluminescence imaging
Haunschild, J.; Reis, I.E.; Geilker, J.; Rein, S.
Journal Article
2011Investigations on the Impact of Wafer Grippers on Optical and Electrical Properties of Alkaline Textured and A-Si Passivated Surfaces
Nold, S.; Aßmus, M.; Weil, A.; Haunschild, J.; Savio, C.; Hofmann, M.; Rentsch, J.; Preu, R.; Kunz, M.
Conference Paper
2011Luminescence imaging for inline characterisation in silicon photovoltaics. Review
Trupke, T.; Nyhus, J.; Haunschild, J.
Journal Article
2011Metal pinning through rear passivation layers: Characterization and effects on solar cells
Saint-Cast, P.; Haunschild, J.; Schwab, C.; Billot, E.; Hofmann, M.; Rentsch, J.; Preu, R.
Conference Paper, Journal Article
2011Quality Control of Czochralski Grown Silicon Wafers in Solar Cell Production Using Photoluminescence Imaging
Haunschild, J.; Broisch, J.; Reis, I.E.; Rein, S.
Conference Paper
2011Verfahren zur Analyse des Erstarrungsverhaltens einer Siliziumschmelze zu einem Siliziumkristall
Haunschild, Jonas; Riepe, Stephan; Haas, F.
Patent
2010Analysis of luminescence images applying pattern recognition techniques
Demant, M.; Glatthaar, M.; Haunschild, J.; Rein, S.
Conference Paper
2010Appearance of rift structures created by acidic texturization and their impact on solar cell efficiency
Nievendick, J.; Demant, M.; Haunschild, J.; Krieg, A.; Souren, F.M.M.; Rein, S.; Zimmer, M.; Rentsch, J.
Conference Paper
2010Evaluating luminescence based voltage images of silicon solar cells
Glatthaar, M.; Haunschild, J.; Zeidler, R.; Demant, M.; Greulich, J.; Michl, B.; Warta, W.; Rein, S.; Preu, R.
Journal Article
2010High aspect ratio front contacts by single step dispensing of metal pastes
Specht, J.; Zengerle, K.; Pospischil, M.; Erath, D.; Haunschild, J.; Clement, F.; Biro, D.
Conference Paper
2010Luminescence imaging for quantitative solar cell material and process characterization
Glatthaar, M.; Haunschild, J.; Zeidler, R.; Rentsch, J.; Rein, S.; Breitenstein, O.; Hinken, D.; Bothe, K.
Conference Paper
2010Quality control of as-cut multicrystalline silicon wafers using photoluminescence imaging for solar cell production
Haunschild, J.; Glatthaar, M.; Demant, M.; Nievendick, J.; Motzko, M.; Rein, S.; Weber, E.R.
Journal Article
2010Quality control using luminescence imaging in production of mc-silicon solar cells from UMG feedstock
Haunschild, J.; Glatthaar, M.; Riepe, S.; Rein, S.
Conference Paper
2010Spatially resolved determination of dark saturation current and series resistance of silicon solar cells
Glatthaar, M.; Haunschild, J.; Kasemann, M.; Giesecke, J.; Warta, W.; Rein, S.
Journal Article
2009Comparing luminescence imaging with illuminated lock-in thermography and carrier density imaging for inline inspection of silicon solar cells
Haunschild, J.; Glatthaar, M.; Kwapil, W.; Rein, S.
Conference Paper
2009Fast series resistance imaging for silicon solar cells using electroluminescence
Haunschild, J.; Glatthaar, M.; Kasemann, M.; Rein, S.; Weber, E.R.
Journal Article
2009Pilot-line processing of screen-printed Cz-Si MWT solar cells exceeding 17% efficiency
Clement, F.; Menkö, M.; Hoenig, R.; Haunschild, J.; Biro, D.; Preu, R.; Lahmer, D.; Lossen, J.; Krokoszinski, H.-J.
Conference Paper
2009Spatially resolved determination of the dark saturation current by electroluminescence imaging
Glatthaar, M.; Giesecke, J.; Kasemann, M.; Haunschild, J.; The, M.; Warta, W.; Rein, S.
Conference Paper
2009Spatially resolved determination of the dark saturation current of silicon solar cells from electroluminescence images
Glatthaar, M.; Giesecke, J.; Kasemann, M.; Haunschild, J.; The, M.; Warta, W.; Rein, S.
Journal Article
2009Verfahren zur ortsaufgeloesten Bestimmung des Serienwiderstandes einer Halbleiterstruktur
Glatthaar, M.; Haunschild, J.; Rein, S.
Patent
2009Verfahren zur Vermessung einer Halbleiterstruktur, welche eine Solarzelle oder eine Vorstufe einer Solarzelle ist
Glatthaar, M.; Haunschild, J.; Rein, S.
Patent
2009Wet chemical processing for c-Si solar cells - status and perspectives
Rentsch, J.; Ackermann, R.; Birmann, K.; Furtwängler, H.; Haunschild, J.; Kästner, G.; Neubauer, R.; Nievendick, J.; Oltersdorf, A.; Rein, S.; Schütte, A.; Zimmer, M.; Preu, R.
Conference Paper
2008Lumineszenzscanner sowie Verfahren zur Detektion von Lumineszenz in Halbleiterbauteilen
Glatthaar, M.; Rein, S.; Haunschild, J.
Patent

 

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