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| 2013 | Doping density in silicon and solar cells analyzed with micrometer resolution
Heinz, F.D.; Gundel, P.; Warta, W.; Schubert, M.C. | Journal Article |
| 2012 | Influence of surface texture on the defect-induced breakdown behavior of multicrystalline silicon solar cells
Kwapil, W.; Nievendick, J.; Zuschlag, A.; Gundel, P.; Schubert, M.C.; Warta, W. | Journal Article |
| 2011 | Comprehensive characterization of advanced cell concepts with sub-micron resolution
Gundel, P.; Drießen, M.; Bartsch, J.; Jäger, U.; Suwito, D.; Heinz, F.D.; Warta, W.; Schubert, M.C. | Conference Paper, Journal Article |
| 2011 | Comprehensive microscopic analysis of laser-induced high doping regions in silicon
Gundel, P.; Suwito, D.; Jäger, U.; Heinz, F.D.; Warta, W.; Schubert, M.C. | Journal Article |
| 2011 | Evaluating the aluminum-alloyed p+-layer of silicon solar cells by emitter saturation current density and optical microspectroscopy measurements
Woehl, R.; Gundel, P.; Krause, J.; Rühle, K.; Heinz, F.D.; Rauer, M.; Schmiga, C.; Schubert, M.C.; Warta, W.; Biro, D. | Journal Article |
| 2011 | Micro-spectroscopy on silicon wafers and solar cells
Gundel, P.; Schubert, M.C.; Heinz, F.D.; Woehl, R.; Benick, J.; Giesecke, J.A.; Suwito, D.; Warta, W. | Journal Article |
| 2011 | Neue mikroskopische Opto-Spektroskopie-Messtechniken für die Photovoltaik
Gundel, P. | Dissertation |
| 2010 | Analysis of performance limiting material properties of multicrystalline silicon
Schubert, M.C.; Kwapil, W.; Schön, J.; Habenicht, H.; Kasemann, M.; Gundel, P.; Blazek, M.; Warta, W. | Journal Article, Conference Paper |
| 2010 | Approach to the physical origin of breakdown in silicon solar cells by optical spectroscopy
Gundel, P.; Kwapil, W.; Schubert, M.C.; Seifert, H.; Warta, W. | Journal Article |
| 2010 | Characterization and optimization of laser edge isolation
Gutscher, S.; Knorz, A.; Gundel, P.; Greulich, J.; Preu, R. | Conference Paper |
| 2010 | High speed laser drilling: Parameter evaluation and characterisation
Knorz, A.; Gutscher, S.; Fell, A.; Gundel, P.; Preu, R. | Conference Paper |
| 2010 | Imaging of metal impurities in silicon by luminescence spectroscopy and synchrotron techniques
Schubert, M.C.; Schön, J.; Gundel, P.; Habenicht, H.; Kwapil, W.; Warta, W. | Journal Article, Conference Paper |
| 2010 | Impact of stress on recombination of metal precipitates in silicon
Gundel, P.; Schubert, M.C.; Heinz, F.D.; Kwapil, W.; Warta, W.; Martinez-Criado, G.; Reiche, M.; Weber, E.R. | Journal Article |
| 2010 | Mapping the quantitative carrier lifetime and doping concentration with micro resolution
Heinz, F.D.; Gundel, P.; Schubert, M.C.; Warta, W. | Conference Paper |
| 2010 | Quantitative carrier lifetime measurement with micron resolution
Gundel, P.; Heinz, F.D.; Schubert, M.C.; Giesecke, J.A.; Warta, W. | Journal Article |
| 2010 | Recombination activity enhancement by stress in silicon
Gundel, P.; Schubert, M.C.; Heinz, F.D.; Warta, W. | Conference Paper |
| 2010 | Simultaneous stress and defect luminescence study on silicon
Gundel, P.; Schubert, M.C.; Warta, W. | Journal Article |
| 2010 | Submicron resolution carrier lifetime analysis in silicon with Fano resonances
Gundel, P.; Schubert, M.C.; Heinz, F.D.; Benick, J.; Zizak, I.; Warta, W. | Journal Article |
| 2009 | Analysis of performance limiting material properties of multicrystalline silicon
Warta, W.; Schubert, M. C.; Habenicht, H.; Kasemann, M.; Kwapil, W.; Gundel, P.; Schön, J. | Conference Paper |
| 2009 | Diode breakdown related to recombination active defects in block-cast multicrystalline silicon solar cells
Kwapil, W.; Kasemann, M.; Gundel, P.; Schubert, M.C.; Warta, W.; Bronsveld, P.; Coletti, G. | Journal Article |
| 2009 | Micro-luminescence spectroscopy on multicrystalline silicon
Gundel, P.; Schubert, M.C.; Kwapil, W.; Schön, J.; Reiche, M.; Savin, H.; Yli-Koski, M.; Sans, J.A.; Martinez-Criado, G.; Warta, W.; Weber, E.R. | Conference Paper |
| 2009 | Micro-photoluminescence spectroscopy on metal precipitates in silicon
Gundel, P.; Schubert, M.C.; Kwapil, W.; Schon, J.; Reiche, M.; Savin, H.; Yli-Koski, M.; Sans, J.A.; Martinez-Criado, G.; Seifert, W.; Warta, W.; Weber, E.R.. | Journal Article |
| 2009 | Observation of metal precipitates at prebreakdown sites in multicrystalline silicon solar cells
Kwapil, W.; Gundel, P.; Schubert, M.C.; Heinz, F.D.; Warta, W.; Weber, E.R.; Goetzberger, A.; Martinez-Criado, G. | Journal Article |
| 2009 | Physical mechanisms of breakdown in multicrystalline silicon solar cells
Kwapil, W.; Kasemann, M.; Gundel, P.; Schubert, M.C.; Warta, W.; Breitenstein, O.; Bauer, J.; Lotnyk, A.; Wagner, J.-M.; Bronsveld, P.C.P.; Coletti, G. | Conference Paper |
| 2009 | X-ray excited optical luminescence from crystalline silicon
Gundel, P.; Martinez-Criado, G.; Schubert, M.C.; Sans, J.A.; Kwapil, W.; Warta, W.; Weber, E.R. | Journal Article |
| 2008 | Analysis of the physical origin of trap centres and their effect on solar cells
Gundel, P.; Schubert, M.; Allardt, M.; Warta, W. | Conference Paper |
| 2008 | Defect transformation in intentionally contaminated FZ silicon during low temperature annealing
Habenicht, H.; Gundel, P.; Mchedlidze, T.; Kittler, M.; Coletti, G.; Warta, W. | Conference Paper |
| 2008 | Origin of trapping in multicrystalline silicon
Gundel, P.; Schubert, M.C.; Warta, W. | Journal Article |
| 2008 | Progress in silicon solar cell characterization with infrared imaging methods
Kasemann, M.; Kwapil, W.; Walter, B.; Giesecke, J.; Michl, B.; The, M.; Wagner, J.-M.; Bauer, J.; Schütt, A.; Carstensen, J.; Kampwerth, H.; Gundel, P.; Schubert, M.C.; Bardos, R.A.; Föll, H.; Nagel, H.; Würfel, P.; Trupke, T.; Breitenstein, O.; Warta, W.; Glunz, S.W. | Conference Paper |
| 2008 | Spatially resolved luminescence spectroscopy on multicrystalline silicon
Schubert, M.C.; Gundel, P.; The, M.; Warta, W.; Romero, M.J.; Ostapenko, S.; Arguirov, T. | Conference Paper |
| 2007 | Advances in infrared imaging methods for silicon material characterization
Schubert, M.C.; The, M.; Gundel, P.; Kasemann, M.; Pingel, S.; Warta, W. | Conference Paper |
| 2007 | Systematic analysis of trapping as a tool to predict diffusion length in multicrystalline silicon cells
Gundel, P.; Schubert, M.C.; Warta, W. | Conference Paper |