Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2015Interaction of ultrashort laser pulses and silicon solar cells under short circuit conditions
Mundus, M.; Giesecke, J.A.; Fischer, P.; Hohl-Ebinger, J.; Warta, W.
Journal Article
2014Understanding carrier lifetime measurements at nonuniform recombination
Giesecke, J.A.; Warta, W.
Journal Article
2013Carrier lifetime from dynamic electroluminescence
Giesecke, J.A.; Schubert, M.C.; Warta, W.
Journal Article
2013Determination of actual carrier lifetime from differential measurements
Giesecke, J.A.; Glunz, S.W.; Warta, W.
Journal Article, Conference Paper
2013Determination of bulk lifetime and surface recombination velocity of silicon ingots from dynamic photoluminescence
Giesecke, J.A.; Sinton, R.A.; Schubert, M.C.; Riepe, S.; Warta, W.
Journal Article
2013Understanding and resolving the discrepancy between differential and actual minority carrier lifetime
Giesecke, J.A.; Glunz, S.W.; Warta, W.
Journal Article
2012Efficiency limiting bulk recombination in multicrystalline silicon solar cells
Michl, B.; Rüdiger, M.; Giesecke, J.A.; Hermle, M.; Warta, W.; Schubert, M.C.
Journal Article
2012Measurement of net dopant concentration via dynamic photoluminescence
Giesecke, J.A.; Schubert, M.C.; Warta, W.
Journal Article
2012Microsecond carrier lifetime measurements in silicon via quasi-steady-state photoluminescence
Giesecke, J.A.; Warta, W.
Journal Article
2012Self-sufficient minority carrier lifetime in silicon from quasi-steady-state photoluminescence
Giesecke, J.A.; Schubert, M.C.; Warta, W.
Journal Article
2012Separation of front and backside surface recombination by photoluminescence imaging on both wafer sides
Michl, B.; Giesecke, J.A.; Warta, W.; Schubert, M.C.
Journal Article
2011From Injection Dependent Lifetime to Solar Cell Efficiency
Michl, B.; Rüdiger, M.; Giesecke, J.A.; Hermle, M.; Warta, W.; Schubert, M.C.
Conference Paper
2011Micro-spectroscopy on silicon wafers and solar cells
Gundel, P.; Schubert, M.C.; Heinz, F.D.; Woehl, R.; Benick, J.; Giesecke, J.A.; Suwito, D.; Warta, W.
Journal Article
2011Minority carrier lifetime imaging of silicon wafers calibrated by quasi-steady-state photoluminescence
Giesecke, J.A.; Schubert, M.C.; Michl, B.; Schindler, F.; Warta, W.
Journal Article
2011Minority carrier lifetime of silicon solar cells from quasi-steady-state photoluminescence
Giesecke, J.A.; Michl, B.; Schindler, F.; Schubert, M.C.; Warta, W.
Journal Article
2011Spatially resolved carrier lifetime calibrated via quasi-steady-state photoluminescence
Giesecke, J.A.; Michl, B.; Schindler, F.; Schubert, M.C.; Warta, W.
Conference Paper, Journal Article
2010Minority carrier lifetime in silicon wafers from quasi-steady-state photoluminescence
Giesecke, J.A.; Schubert, M.C.; Walter, D.; Warta, W.
Journal Article
2010Quantitative carrier lifetime measurement with micron resolution
Gundel, P.; Heinz, F.D.; Schubert, M.C.; Giesecke, J.A.; Warta, W.
Journal Article
2010Separation of local bulk and surface recombination in crystalline silicon from luminescence reabsorption
Giesecke, J.A.; Kasemann, M.; Schubert, M.C.; Würfel, P.; Warta, W.
Journal Article
2010Simultaneous determination of carrier lifetime and net dopant concentration of silicon wafers from photoluminescence
Giesecke, J.A.; Walter, D.; Kopp, F.; Rosenits, P.; Schubert, M.C.; Warta, W.
Conference Paper
2009Determination of local minority carrier diffusion lengths in crystalline silicon from luminescence images
Giesecke, J.A.; Kasemann, M.; Warta, W.
Journal Article
2009Separation of recombination properties of silicon solar cells and wafers via luminescence imaging
Giesecke, J.A.; Kasemann, M.; Warta, W.
Conference Paper
2009Spatially resolved characterization of silicon as-cut wafers with photoluminescence imaging
Giesecke, J.A.; The, M.; Kasemann, M.; Warta, W.
Journal Article