Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2017Material limits of multicrystalline silicon from state-of-the-art photoluminescence imaging techniques
Schindler, F.; Giesecke, J.; Michl, B.; Schön, J.; Krenckel, P.; Riepe, S.; Warta, W.; Schubert, M.C.
Journal Article, Conference Paper
2016Improving the material quality of silicon ingots by aluminum gettering during crystal growth
Schön, J.; Krenckel, P.; Karches, B.; Schindler, F.; Giesecke, J.; Stieghorst, C.; Wiehl, N.; Schubert, M.C.; Riepe, S.
Journal Article
2016Material limits of silicon from state-of-the-art photoluminescence imaging techniques
Schindler, F.; Giesecke, J.; Michl, B.; Schön, J.; Krenckel, P.; Riepe, S.; Warta, W.; Schubert, M.C.
Conference Paper
2015Harmonically modulated luminescence: Bridging gaps in carrier lifetime metrology across the PV processing chain
Giesecke, J.; Schubert, M.C.; Schindler, F.; Warta, W.
Journal Article
2015Interaction of ultrashort laser pulses and silicon solar cells under short circuit conditions
Mundus, M.; Giesecke, J.A.; Fischer, P.; Hohl-Ebinger, J.; Warta, W.
Journal Article
2015Iron related solar cell instability: Imaging analysis and impact on cell performance
Schubert, M.C.; Padilla, M.; Michl, B.; Mundt, L.; Giesecke, J.; Hohl-Ebinger, J.; Benick, J.; Warta, W.; Tajima, M.; Ogura, A.
Journal Article
2015On the implication of spatial carrier density non-uniformity on lifetime determination in silicon
Heinz, F.D.; Giesecke, J.; Mundt, L.E.; Kasemann, M.; Warta, W.; Schubert, M.C.
Journal Article
2014Efficiency-limiting recombination in multicrystalline silicon solar cells
Schubert, M.C.; Schön, J.; Abdollahinia, A.; Michl, B.; Kwapil, W.; Schindler, F.; Heinz, F.; Padilla, M.; Giesecke, J.; Breitwieser, M.; Riepe, S.; Warta, W.
Conference Paper
2014Quantitative Recombination and Transport Properties in Silicon from Dynamic Luminescence
Giesecke, J.
Dissertation
2014Towards a unified low-field model for carrier mobilities in crystalline silicon
Schindler, F.; Forster, M.; Broisch, J.; Schön, J.; Giesecke, J.; Rein, S.; Warta, W.; Schubert, M.C.
Journal Article
2014Understanding carrier lifetime measurements at nonuniform recombination
Giesecke, J.A.; Warta, W.
Journal Article
2014Verfahren und Vorrichtung zur Bestimmung von Materialparametern, insbesondere der Ladungsträgerlebensdauer eines Halbleitersubstrates durch Messung von Lumineszenzstrahlung
Giesecke, Johannes; Schubert, Martin; Warta, Wilhelm
Patent
2014Verfahren zur Bestimmung der tatsächlichen Ladungsträger-Lebensdauer eines Halbleitersubstrates aus einer dynamischen und differentiellen Messung der Relaxationszeit freier Ladungsträger
Giesecke, Johannes; Warta, Wilhelm; Glunz, Stefan
Patent
2013Accurate determination of minority carrier mobility in silicon from quasi-steady-state photoluminescence
Giesecke, J.; Schindler, F.; Bühler, M.; Schubert, M.; Warta, W.
Journal Article
2013Carrier lifetime from dynamic electroluminescence
Giesecke, J.A.; Schubert, M.C.; Warta, W.
Journal Article
2013Determination of actual carrier lifetime from differential measurements
Giesecke, J.A.; Glunz, S.W.; Warta, W.
Journal Article, Conference Paper
2013Determination of bulk lifetime and surface recombination velocity of silicon ingots from dynamic photoluminescence
Giesecke, J.A.; Sinton, R.A.; Schubert, M.C.; Riepe, S.; Warta, W.
Journal Article
2013Understanding and resolving the discrepancy between differential and actual minority carrier lifetime
Giesecke, J.A.; Glunz, S.W.; Warta, W.
Journal Article
2012Broad Range Injection-Dependent Minority Carrier Lifetime from Photoluminescence
Giesecke, J.; Niewelt, T.; Rüdiger, M.; Rauer, M.; Schubert, M.; Warta, W.
Journal Article
2012Efficiency limiting bulk recombination in multicrystalline silicon solar cells
Michl, B.; Rüdiger, M.; Giesecke, J.A.; Hermle, M.; Warta, W.; Schubert, M.C.
Journal Article
2012Measurement of net dopant concentration via dynamic photoluminescence
Giesecke, J.A.; Schubert, M.C.; Warta, W.
Journal Article
2012Microsecond carrier lifetime measurements in silicon via quasi-steady-state photoluminescence
Giesecke, J.A.; Warta, W.
Journal Article
2012Passivation layers for indoor solar cells at low irradiation intensities
Rühle, K.; Rauer, M.; Rüdiger, M.; Giesecke, J.; Niewelt, T.; Schmiga, C.; Glunz, S.W.; Kasemann, M.
Journal Article, Conference Paper
2012Self-sufficient minority carrier lifetime in silicon from quasi-steady-state photoluminescence
Giesecke, J.A.; Schubert, M.C.; Warta, W.
Journal Article
2012Separation of front and backside surface recombination by photoluminescence imaging on both wafer sides
Michl, B.; Giesecke, J.A.; Warta, W.; Schubert, M.C.
Journal Article
2011From Injection Dependent Lifetime to Solar Cell Efficiency
Michl, B.; Rüdiger, M.; Giesecke, J.A.; Hermle, M.; Warta, W.; Schubert, M.C.
Conference Paper
2011Micro-spectroscopy on silicon wafers and solar cells
Gundel, P.; Schubert, M.C.; Heinz, F.D.; Woehl, R.; Benick, J.; Giesecke, J.A.; Suwito, D.; Warta, W.
Journal Article
2011Minority carrier lifetime imaging of silicon wafers calibrated by quasi-steady-state photoluminescence
Giesecke, J.A.; Schubert, M.C.; Michl, B.; Schindler, F.; Warta, W.
Journal Article
2011Minority carrier lifetime of silicon solar cells from quasi-steady-state photoluminescence
Giesecke, J.A.; Michl, B.; Schindler, F.; Schubert, M.C.; Warta, W.
Journal Article
2011Spatially resolved carrier lifetime calibrated via quasi-steady-state photoluminescence
Giesecke, J.A.; Michl, B.; Schindler, F.; Schubert, M.C.; Warta, W.
Conference Paper, Journal Article
2010Conductivity mobility and hall mobility in compensated multicrystalline silicon
Schindler, F.; Geilker, J.; Kwapil, W.; Giesecke, J.; Schubert, M.C.; Warta, W.
Conference Paper
2010Minority carrier lifetime in silicon wafers from quasi-steady-state photoluminescence
Giesecke, J.A.; Schubert, M.C.; Walter, D.; Warta, W.
Journal Article
2010Quantitative carrier lifetime measurement with micron resolution
Gundel, P.; Heinz, F.D.; Schubert, M.C.; Giesecke, J.A.; Warta, W.
Journal Article
2010The role of material quality in EWT and standard solar cells on multicrystalline standard and UMG silicon material
Schubert, M.C.; Rüdiger, M.; Michl, B.; Schindler, F.; Kwapil, W.; Giesecke, J.; Hermle, M.; Warta, W.; Ferré, R.; Wade, R.; Petter, K.
Conference Paper
2010Separation of local bulk and surface recombination in crystalline silicon from luminescence reabsorption
Giesecke, J.A.; Kasemann, M.; Schubert, M.C.; Würfel, P.; Warta, W.
Journal Article
2010Simultaneous determination of carrier lifetime and net dopant concentration of silicon wafers from photoluminescence
Giesecke, J.A.; Walter, D.; Kopp, F.; Rosenits, P.; Schubert, M.C.; Warta, W.
Conference Paper
2010Spatially resolved determination of dark saturation current and series resistance of silicon solar cells
Glatthaar, M.; Haunschild, J.; Kasemann, M.; Giesecke, J.; Warta, W.; Rein, S.
Journal Article
2010Verfahren zur Bestimmung von Materialparametern eines dotierten Halbleitersubstrates durch Messung von Photolumineszenzstrahlung
Giesecke, J.
Patent
2009Determination of local minority carrier diffusion lengths in crystalline silicon from luminescence images
Giesecke, J.A.; Kasemann, M.; Warta, W.
Journal Article
2009Separation of recombination properties of silicon solar cells and wafers via luminescence imaging
Giesecke, J.A.; Kasemann, M.; Warta, W.
Conference Paper
2009Spatially resolved characterization of silicon as-cut wafers with photoluminescence imaging
Giesecke, J.A.; The, M.; Kasemann, M.; Warta, W.
Journal Article
2009Spatially resolved determination of the dark saturation current by electroluminescence imaging
Glatthaar, M.; Giesecke, J.; Kasemann, M.; Haunschild, J.; The, M.; Warta, W.; Rein, S.
Conference Paper
2009Spatially resolved determination of the dark saturation current of silicon solar cells from electroluminescence images
Glatthaar, M.; Giesecke, J.; Kasemann, M.; Haunschild, J.; The, M.; Warta, W.; Rein, S.
Journal Article
2008Application of luminescence imaging based series resistance measurement methods in an industrial environment
Michl, B.; Kasemann, M.; Giesecke, J.; Glatthaar, M.; Schütt, A.; Carstensen, J.; Föll, H.; Rein, S.; Warta, W.; Nagel, H.
Conference Paper
2008Determination of minority carrier diffusion lengths in silicon solar cells from photoluminescence images
Giesecke, J.; Kasemann, M.; Schubert, M.C.; Michl, B.; The, M.; Warta, W.; Würfel, P.
Conference Paper
2008Investigations on the pre-breakdown of multicrystalline silicon solar cells
Kwapil, W.; Kasemann, M.; Giesecke, J.; Michl, B.; Warta, W.
Conference Paper
2008Progress in silicon solar cell characterization with infrared imaging methods
Kasemann, M.; Kwapil, W.; Walter, B.; Giesecke, J.; Michl, B.; The, M.; Wagner, J.-M.; Bauer, J.; Schütt, A.; Carstensen, J.; Kampwerth, H.; Gundel, P.; Schubert, M.C.; Bardos, R.A.; Föll, H.; Nagel, H.; Würfel, P.; Trupke, T.; Breitenstein, O.; Warta, W.; Glunz, S.W.
Conference Paper
2008Spatially resolved characterisation of silicon as-cut wafers with photoluminescence imaging
The, M.; Giesecke, J.; Kasemann, M.; Warta, W.
Conference Paper
2008Verfahren zur Messung der Lumineszenzstrahlung einer Halbleiterstruktur
Giesecke, J.
Patent