Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
20193D-Inline-Messtechnik
Seyler, Tobias; Fratz, Markus; Beckmann, Tobias; Schiller, Annelie; Engler, Johannes; Bertz, Alexander; Carl, Daniel
Journal Article
2019Digital Holographic Microscopy for 200 € Using Open-Source Hard- and Software
Beckmann, Tobias; Fratz, Markus; Schiller, Annelie; Bertz, Alexander; Carl, Daniel
Conference Paper
2019Industrial applications of digital holography
Fratz, Markus; Beckmann, Tobias; Anders, Joachim; Bertz, Alexander; Bayer, Markus; Gießler, Thomas; Carl, Daniel
Conference Paper
2019Inline application of digital holography [Invited]
Fratz, Markus; Beckmann, Tobias; Anders, Joachim; Bertz, Alexander; Bayer, Markus; Gießler, Thomas; Nemeth, Christian; Carl, Daniel
Journal Article
2019Motion compensation for interferometric off-center measurements of rotating objects with varying radii
Schiller, Annelie; Beckmann, Tobias; Fratz, Markus; Bertz, Alexander; Carl, Daniel; Buse, Karsten
Journal Article
2019Multiwavelength digital holography in the presence of vibrations: Laterally resolved multi-step phase-shift extraction
Seyler, Tobias; Bienkowski, Lasse; Beckmann, Tobias; Fratz, Markus; Bertz, Alexander; Carl, Daniel
Conference Paper
2019Multiwavelength digital holography in the presence of vibrations: Laterally resolved multistep phase-shift extraction
Seyler, Tobias; Bienkowski, Lasse; Beckmann, Tobias; Fratz, Markus; Bertz, Alexander; Carl, Daniel
Journal Article
2019Multiwavelength Holography: Height Measurements Despite Axial Motion of Several Wavelengths During Exposure
Schiller, Annelie; Beckmann, Tobias; Fratz, Markus; Bertz, Alexander; Carl, Daniel; Buse, Karsten
Conference Paper
2019Multiwavelength holography: Height measurements despite axial motion of several wavelengths during exposure
Schiller, Annelie; Beckmann, Tobias; Fratz, Markus; Bertz, Alexander; Carl, Daniel; Buse, Karsten
Journal Article
2018Extending the depth of field beyond geometrical imaging limitations using phase noise as a focus measure in multiwavelength digital holography
Seyler, Tobias; Fratz, Markus; Beckmann, Tobias; Schiller, Annelie; Bertz, Alexander; Carl, Daniel
Journal Article
2018Extensive microstructural quality control inside a machine tool using multiwavelength digital holography
Seyler, Tobias; Fratz, Markus; Beckmann, Tobias; Bertz, Alexander; Carl, Daniel; Grün, Viktor; Börret, Rainer; Ströer, Felix; Seewig, Jörg
Conference Paper
2018Messen am eingerichteten Werkstück
Seyler, Tobias; Fratz, Markus; Grün, Viktor; Börret, Rainer; Ströer, Felix; Seewig, Jörg
Journal Article
2018Multiwavelength digital holography: Height measurements on linearly moving and rotating objects
Schiller, Annelie; Beckmann, Tobias; Fratz, Markus; Bertz, Alexander; Carl, Daniel; Buse, Karsten
Conference Paper
20173D-Oberflächenmessung mit digitaler Mehrwellenlängen-Holographie
Fratz, Markus; Beckmann, Tobias
Book Article
2017Digital holography on moving objects
Schiller, Annelie; Beckmann, Tobias; Fratz, Markus; Belzer, Dominik; Bertz, Alexander; Carl, Daniel; Buse, Karsten
Journal Article
2017Digital holography on moving objects. Multiwavelength height measurements on inclined surfaces
Schiller, Annelie; Beckmann, Tobias; Fratz, Markus; Belzer, Dominik; Bertz, Alexander; Carl, Daniel; Buse, Karsten
Conference Paper
2017Digital holography: Evolution from a research topic to a versatile tool for the inline 100% 3D quality control in industry
Fratz, Markus; Beckmann, Tobias; Schiller, Annelie; Seyler, Tobias; Bertz, Alexander; Carl, Daniel; Buse, Karsten
Conference Paper
2017Miniaturized multiwavelength digital holography sensor for extensive in-machine tool measurement
Seyler, Tobias; Fratz, Markus; Beckmann, Tobias; Bertz, Alexander; Carl, Daniel
Conference Paper
2016Geprüfte Oberflächen. Sub-µm Inline-3D-Oberflächenprüfung im Sekundentakt
Fratz, Markus; Beckmann, Tobias; Bertz, Alexander; Carl, Daniel
Journal Article
2016Multiwavelength digital holography with spatial phase shifting on moving objects
Schiller, Annelie F.; Beckmann, Tobias; Fratz, Markus; Belzer, Dominik; Bertz, Alexander; Carl, Daniel; Buse, Karsten
Conference Paper
2016Vorrichtung und Verfahren zur Vermessung eines Höhenprofils einer Oberfläche unter Verwendung einer länglichen Blende
Fratz, Markus; Beckmann, Tobias
Patent
2016Vorrichtung und Verfahren zur Vermessung eines Höhenprofils einer Oberfläche unter Verwendung zumindest eines dispersiven Elementes
Beckmann, Tobias; Fratz, Markus
Patent
2015Synthetic-wavelength interferometry improved with frequency calibration and unambiguity range extension
Weimann, Claudius; Fratz, Markus; Wölfelschneider, Harald; Freude, Wolfgang; Höfler, Heinrich; Koos, Christian
Journal Article
2014Absolutely referenced distance measurement by combination of time-of-flight and digital holographic methods
Fratz, Markus; Weimann, Claudius; Wölfelschneider, Harald; Koos, Christian; Höfler, Heinrich
Conference Paper
2014High-speed deformation measurement using spatially phase-shifted speckle interferometry
Beckmann, Tobias; Fratz, Markus; Bertz, Alexander; Carl, Daniel
Conference Paper
2014Novel industry ready sensors for shape measurement based on multi wavelength digital holography
Fratz, Markus; Carl, Daniel
Conference Paper
2014Verformungsmessung an elektronischen Bauteilen und Baugruppen mit Grauwertkorrelation und Holografie
Steiert, Matthias; Zeiser, Roderich; Berndt, Michael; Wilde, Jürgen; Beckmann, Tobias; Fratz, Markus
Conference Paper
2013Optische Verformungsmessungen an Mikrosystemen bei extremen Temperaturdifferenzen
Fratz, Markus; Carl, Daniel; Zeiser, Roderich; Berndt, Michael
Journal Article
2013Verformung von Mikrosystemen bei hohen Temperaturen
Berndt, Michael; Carl, Daniel; Fratz, Markus; Steiert, Matthias; Zeiser, Roderich
Conference Paper
2013Verformungsmessung von Mikrosystemen bei hohen Temperaturen mit ESPI, DIC und Holographie
Zeiser, Roderich; Steiert, Matthias; Berndt, Michael; Wilde, Jürgen; Beckmann, Tobias; Fratz, Markus
Conference Paper
2012Digital-holographischer Mehrwellenlängensensor HoloTop zur 100-Prozent-Kontrolle von Oberflächen
Carl, Daniel; Fratz, Markus; Giel, Dominik; Höfler, Heinrich
Journal Article
2010Computer-generierte Polarisationshologramme zur vollständigen Kontrolle über Amplitude und Phase
Fratz, Markus; Fischer, Peer; Giel, Dominik
Journal Article, Conference Paper
2010Herstellung polarisationsholografischer optischer Elemente durch Laserbelichtung in Azobenzen-Polymeren
Fratz, Markus
Dissertation
2010Hochauflösendes 3D-Messystem auf Basis eines neuartigen digitalholografischen Multilambda-Sensors
Pfeifer, Marcel; Fratz, Markus; Carl, Daniel; Skoczowsky, D.; Giel, Dominik; Heuer, A.; Höfler, Heinrich
Journal Article, Conference Paper
2010Realisierung eines hochauflösenden optischen Sensors auf Basis digitaler Mehrwellenlängenholografie
Megel, Lysann; Carl, Daniel; Fratz, Markus; Knoll, Gerhard; Jetter, Volker; Giel, Dominik; Höfler, Heinrich
Journal Article, Conference Paper