Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2000Single-ion micromechanics
Fischer, B.E.; Metzger, S.
Journal Article
1999An example of what you can miss in single-event-effect testing, when you do not have a microprobe
Adler, E.; Barak, J.; Fischer, B.E.; Metzger, S.; Schlögl, M.
Journal Article
1998Computer-forgetfulness, cosmic radiation, and an ion-microscope
Adler, E.; Barak, J.; Fischer, B.E.; Metzger, S.
Journal Article
1998Microbeam mapping of single event latchups and single event upsets in CMOS SRAMs
Barak, J.; Adler, E.; Fischer, B.E.; Schlögl, M.; Metzger, S.
Journal Article
1998Microbeam mapping of single event latchups and single event upsets in CMOS SRAMs
Barak, J.; Adler, E.; Fischer, B.E.; Schlogl, M.; Metzger, Stefan
Conference Paper
1997Simultaneous imaging of upset- and latchup-sensitive regions in a static RAM
Fischer, B.E.; Schlögl, M.; Barak, J.; Adler, E.; Metzger, S.
Journal Article, Conference Paper
1996Locating radiation sensitive zones of integrated circuits using an ion-microprobe
Metzger, Stefan; Fischer, B.E.
Journal Article
1994Heavy ion microscopy of single event upsets in CMOS SRAMs
Metzger, Stefan; Dreute, J.; Heinrich, W.; Röcher, H.; Fischer, B.E.; Harboe-Sorensen, R.; Adams, L.
Journal Article
1994Heavy ion microscopy of single event upsets in CMOS SRAMs
Metzger, Stefan; Dreute, J.; Heinrich, W.; Röcher, H.; Fischer, B.E.; Harboe-Sorensen, R.; Adams, L.
Journal Article
1994Heavy ion microscopy of single event upsets in CMOS SRAMs
Metzger, Stefan; Dreute, J.; Heinrich, W.; Röcher, H.; Fischer, B.E.; Harboe-Sorensen, R.; Adams, L.
Conference Paper
1989Secondary molecule mass spectroscopy at the GSI heavy ion microprobe
Metzger, Stefan; Fischer, B.E.
Journal Article