Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2003Polymer-embedded host-guest systems
Schneider, J.; Fanter, D.; Bauer, M.
Book Article
2000Preparation and optical transparency of composite materials from methacrylate ester copolymers and faujasites with an embedded azo dye
Schneider, J.; Fanter, D.; Bauer, M.; Schomburg, C.; Wöhrle, D.; Schulz-Ekloff, G.
Journal Article
1998Herstellung und optisches Verhalten von Compositen aus Methacrylat-Copolymeren und farbstoffbeladenen Zeolithen
Schneider, J.; Fanter, D.; Bauer, M.
Conference Paper
1997Embedding of zeolithes in a polymer matrix-adapting of refractive index
Bauer, M.; Fanter, D.; Schneider, J.
Conference Paper
1996Studies on the interphase of a model adhesive joint
Possart, W.; Fanter, D.; Dieckhoff, S.; Gesang, T.; Hartwig, A.; Höper, R.; Schlett, V.; Hennemann, O.-D.
Journal Article
1995AFM investigations of the initial stages of prepolymer film growth on aluminium
Gesang, T.; Höper, R.; Dieckhoff, S.; Fanter, D.; Hartwig, A.; Possart, W.; Hennemann, O.-D.
Journal Article
1995Analysis of thin cyanurate prepolymer films on solids as a model of the adhesive interphase
Possart, W.; Dieckhoff, S.; Fanter, D.; Gesang, T.; Hartwig, A.; Höper, R.; Schlett, V.; Hennemann, O.-D.
Conference Paper
1995Comparative film thickness determination by atomic force microscopy and ellipsometry for ultrathin prepolymer films
Gesang, T.; Fanter, D.; Höper, R.; Possart, W.; Hennemann, O.-D.
Journal Article
1995A comparison of scanning force microscopy and ellipsometry for thickness determination of ultrathin polymer films
Gesang, T.; Fanter, D.; Höper, R.; Possart, W.; Hennemann, O.-D.
Conference Paper
1995A comparison of scanning force microscopy and ellipsometry for thickness determination of ultrathin polymer films
Gesang, T.; Fanter, D.; Höper, R.; Possart, W.; Hennemann, O.-D.
Conference Paper, Journal Article
1995Infrared reflection spectroscopy of polycyanurate thin films on solids - state of the interphase
Possart, W.; Fanter, D.; Bauer, M.; Hartwig, A.; Hennemann, O.-D.
Journal Article
1995Licht untersucht dünnste Schichten
Fanter, D.; Possart, W.; Hennemann, O.-D.
Journal Article
1994IR spectroscopic study of very thin prepolymer films on silicon and on aluminium
Possart, W.; Fanter, D.; Hartwig, A.; Hennemann, O.-D.; Bauer, M.
Conference Paper
1994Ultrathin polymer coatings investigated by atomic force microscopy and ellipsometry
Gesang, T.; Fanter, D.; Höper, R.; Possart, W.; Hennemann, O.-D.
Conference Paper
1992Computer program XPSFIT for estimating the binding state in atoms of solid materials from x-ray photoelectron spectroscopy (core-level XPS)
Fanter, D.; Possart, W.
Journal Article