Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2021X-ray-Based Techniques to Study the Nano-Bio Interface
Sanchez-Cano, C.; Alvarez-Puebla, R.A.; Abendroth, J.M.; Beck, T.; Blick, R.; Cao, Y.; Caruso, F.; Chakraborty, I.; Chapman, H.N.; Chen, C.; Cohen, B.E.; Conceição, A.L.C.; Cormode, D.P.; Cui, D.; Dawson, K.A.; Falkenberg, G.; Fan, C.; Feliu, N.; Gao, M.; Gargioni, E.; Glüer, C.-C.; Grüner, F.; Hassan, M.; Hu, Y.; Huang, Y.; Huber, S.; Huse, N.; Kang, Y.; Khademhosseini, A.; Keller, T.F.; Körnig, C.; Kotov, N.A.; Koziej, D.; Liang, X.-J.; Liu, B.; Liu, S.; Liu, Y.; Liu, Z.; Liz-Marzan, L.M.; Ma, X.; Machicote, A.; Maison, W.; Mancuso, A.P.; Megahed, S.; Nickel, B.; Otto, F.; Palencia, C.; Pascarelli, S.; Pearson, A.; Penate-Medina, O.; Qi, B.; Rädler, J.; Richardson, J.J.; Rosenhahn, A.; Rothkamm, K.; Rübhausen, M.; Sanyal, M.K.; Schaak, R.E.; Schlemmer, H.-P.; Schmidt, M.; Schmutzler, O.; Schotten, T.; Schulz, F.; Sood, A.K.; Spiers, K.M.; Staufer, T.; Stemer, D.M.; Stierle, A.; Sun, X.; Tsakanova, G.; Weiss, P.S.; Weller, H.; Westermeier, F.; Xu, M.; Yan, H.; Zeng, Y.; Zhao, Y.; Zhao, Y.; Zhu, D.;
Review
2020Hard X-ray wavefront correction via refractive phase plates made by additive and subtractive fabrication techniques
Seiboth, F.; Brückner, D.; Kahnt, M.; Lyubomirskiy, M.; Wittwer, F.; Dzhigaev, D.; Ullsperger, T.; Nolte, S.; Koch, F.; David, C.; Garrevoet, J.; Falkenberg, G.; Schroer, C.G.
Journal Article
2017Perfect X-ray focusing via fitting corrective glasses to aberrated optics
Seiboth, F.; Schropp, A.; Scholz, M.; Wittwer, F.; Rödel, C.; Wünsche, M.; Ullsperger, T.; Nolte, S.; Rahomäki, J.; Parfeniukas, K.; Giakoumidis, S.; Vogt, U.; Wagner, U.; Rau, C.; Boesenberg, U.; Garrevoet, J.; Falkenberg, G.; Galtier, E.C.; Lee, H.J.; Nagler, B.; Schroer, C.G.
Journal Article
2017Simplex Volume Maximization (SiVM): A matrix factorization algorithm with non-negative constrains and low computing demands for the interpretation of full spectral X-ray fluorescence imaging data
Alfeld, M.; Wahabzada, M.; Bauckhage, C.; Kersting, K.; Snickt, G. van der; Noble, P.; Janssens, K.; Wellenreuther, G.; Falkenberg, G.
Journal Article
2016Non-negative matrix factorization for the near real-time interpretation of absorption effects in elemental distribution images acquired by X-ray fluorescence imaging
Alfeld, M.; Wahabzada, M.; Bauckhage, C.; Kersting, K.; Wellenreuther, G.; Barriobero-Vila, P.; Requena, G.; Boesenberg, U.; Falkenberg, G.
Journal Article
2014Non-negative factor analysis supporting the interpretation of elemental distribution images acquired by XRF
Alfeld, M.; Wahabzada, M.; Bauckhage, C.; Kersting, K.; Wellenreuther, G.; Falkenberg, G.
Conference Paper
2005Modifications and color markings in glasses by UV laser radiation
Talkenberg, M.; Falkenberg, G.; Krauss, M.; Kreutz, H.W.
Conference Paper
1999Reflectivity of Ni/C Multilayer X-Ray Mirrors in the Energy Range 8-70 keV
Falkenberg, G; Holz, T.; Franz, H.
Book Article