Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2018Four-channel terahertz time-domain spectroscopy system for industrial pipe inspection
Klier, Jens; Kharik, Dmytro; Zwetow, Wladimir; Gundacker, Dominic; Weber, Stefan; Molter, Daniel; Ellrich, Frank; Joachim Jonuscheit; Freymann, Georg von
Conference Paper
2018Interferometry-aided terahertz time-domain spectroscopy for robust measurements in reflection
Molter, Daniel; Weber, Stefan; Pfeiffer, Tobias; Klier, Jens; Bachtler, Sebastian; Ellrich, Frank; Jonuscheit, Joachim; Freymann, Georg von
Conference Paper
2017All-polarization-maintaining, polarization-multiplexed, gain-coupled, mode-locked fiber laser
Kolano, M.; Gräf, B.; Molter, D.; Ellrich, F.; Freymann, G. von
Conference Paper
2017Interferometry-aided terahertz time-domain spectroscopy
Molter, D.; Trierweiler, M.; Ellrich, F.; Jonuscheit, J.; Freymann, G. von
Journal Article
2017Thickness determination of wet coatings using self-calibration method
Weber, Stefan; Ellrich, Frank; Paustian, Stephan; Güttler, Nico; Tiedje, Oliver; Jonuscheit, Joachim; Freymann, Georg von
Conference Paper
2016All-polarization-maintaining, polarization-multiplexed, dual-frequency, mode-locked fiber laser
Kolano, M.; Gräf, B.; Molter, D.; Ellrich, F.; Freymann, G. von
Conference Paper
2016Interferometry-aided delay lines for high-precision terahertz time-domain spectroscopy
Molter, Daniel; Trierweiler, Manuel; Ellrich, Frank; Jonuscheit, Joachim; Freymann, Georg von
Conference Paper
2016Terahertz time-domain technology for thickness determination of industrial relevant multi-layer coatings
Ellrich, Frank; Klier, Jens; Weber, Stefan; Jonuscheit, Joachim; Freymann, Georg von
Conference Paper
2016Verfahren zur Spektrometrie und Spektrometer
Molter, Daniel; Ellrich, Frank
Patent
2015An evolutionary algorithm based approach to improve the limits of minimum thickness measurements of multilayered automotive paints
Krimi, Soufiene; Klier, Jens; Ellrich, Frank; Jonuscheit, Joachim; Urbansky, R.; Beigang, René; Freymann, Georg von
Conference Paper
2015Influence of substrate material on radiation characteristics of THz photoconductive emitters
Klier, J.; Torosyan, G.; Schreiner, N.S.; Molter, D.; Ellrich, F.; Zouaghi, W.; Peytavit, E.; Lampin, J.F.; Beigang, R.; Jonuscheit, J.; Freymann, G. von
Journal Article
2015Optische Anrege-/Abfrageanordnung
Molter, Daniel; Ellrich, Frank
Patent
2015Verfahren zur Spektrometrie und Spektrometer
Ellrich, Frank; Molter, Daniel; Fredebeul, Christoph; Platte, Frank; Nalpantidis, Konstantinos
Patent
2015Verfahren zur Spektrometrie und Spektrometer
Molter, Daniel; Ellrich, Frank; Hübsch, Daniel; Sprenger, Thorsten
Patent
2014Comparison of terahertz technologies for detection and identification of explosives
Beigang, Renè; Biedron, Sandra; Dyjak, Slawomir; Ellrich, Frank; Haakestad, Magnus; Hübsch, Daniel; Kartaloglu, Tolga; Ozbay, Ekmel; Ospald, Frank; Palka, Norbert; Puc, Uros; Czerwińska, Elżbieta; Sahin, Asaf B.; Sesek, Aleksander; Trontelj, Janez; Švigelj, Andrej; Altan, Hakan; Rheenen, Arthur D. van; Walczakowski, Michal
Conference Paper
2014Improved substance identification by suppression of multiple-reflection-induced spectral noise
Ellrich, F.; Molter, D.; Krimi, S.; Jonuscheit, J.; Freymann, G. von; Platte, F.; Fredebeul, C.; Nalpantidis, K.; Hübsch, D.; Würschmidt, T.; Sprenger, T.
Conference Paper
2014Kollimator für elektromagnetische Hochfrequenzstrahlung
Ellrich, Frank
Patent
2014Multi-step pattern-recognition: A powerful tool for substance identification based on real-world terahertz-spectra
Ellrich, F.; Molter, D.; Jonuscheit, J.; Freymann, G. von; Beigang, R.; Platte, F.; Nalpantidis, K.; Sprenger, T.; Hübsch, D.
Conference Paper
2013Fiber-coupled terahertz time-domain spectroscopy (THz-TDS) systems
Theuer, Michael; Ellrich, Frank; Molter, Daniel; Beigang, René
Book Article
2013Revealing the invisible - identifying concealed substances by means of terahertz spectroscopy
Jonuscheit, Joachim; Molter, Daniel; Ellrich, Frank; Beigang, René; Platte, Frank; Nalpantidis, Konstantinos
Journal Article
2012All-solid-state THz ATR spectroscopy module
Molter, D.; Torosyan, G.; Klier, J.; Matheis, C.; Petermann, C.; Weber, S.; Ellrich, F.; Jonuscheit, J.; Beigang, R.
Conference Paper
2012Berührungslose Mehrlagen-Schichtdickenmessung industrieller Beschichtungen mittels THz-Messtechnik
Feige, V.K.S.; Berta, M.; Ellrich, F.; Jonuscheit, J.; Beigang, R.
Journal Article
2012Chemometric tools for analysing Terahertz fingerprints in a postscanner
Ellrich, Frank; Torosyan, Garik; Wohnsiedler, Sabine; Bachtler, Sebastian; Hachimi, A.; Jonuscheit, Joachim; Beigang, René; Platte, F.; Nalpantidis, K.; Sprenger, T.; Hübsch, D.
Conference Paper
2012Unsichtbares sichtbar machen - versteckte Substanzen mittels Terahertz-Spektroskopie identifizieren
Jonuscheit, J.; Molter, D.; Ellrich, F.; Beigang, R.; Platte, F.; Nalpantidis, K.
Journal Article
2011Compact fiber-coupled terahertz spectroscopy system pumped at 800 nm wavelength
Ellrich, F.; Weinland, T.; Molter, D.; Jonuscheit, J.; Beigang, R.
Journal Article
2011Handheld miniature THz ATR module
Molter, D.; Torosyan, G.; Klier, J.; Matheis, C.; Petermann, C.; Weber, S.; Ellrich, F.; Jonuscheit, J.; Beigang, R.
Conference Paper
2011Non-contact multilayer thickness measurements with reflection-mode terahertz time-domain spectroscopy
Feige, V.; Nix, S.; Ellrich, F.; Jonuscheit, J.; Beigang, R.
Conference Paper
2011Terahertz time-domain magneto-optics using pulsed magnetic fields
Molter, D.; Ellrich, F.; Weinland, T.; George, S.; Goiran, M.; Keilmann, F.; Beigang, R.; Léotin, J.
Conference Paper
2010Angle-resolved THz time domain reflection spectroscopy of rough surfaces
Robiné, C.D.; Wiegand, C.; Rühle, K.; Ellrich, F.; Weinland, T.; Beigang, R.
Conference Paper
2010High-speed terahertz time-domain spectroscopy of cyclotron resonance in pulsed magnetic field
Molter, D.; Ellrich, F.; Weinland, T.; George, S.; Goiran, M.; Keilmann, F.; Beigang, R.; Leotin, J.
Journal Article
2010Terahertz time domain spectroscopy for nondestructive testing and sensing applications
Ellrich, F.; Herrmann, M.; Jonuscheit, J.; Theuer, M.; Torosyan, G.; Molter, D.; Wiegand, S.; Wohnsiedler, S.; Beigang, R.
Conference Paper
2010Terahertz-Wellen - ein neuer Spektralbereich für die industrielle Messtechnik
Ellrich, F.; Klier, J.; Jonuscheit, J.; Weinland, T.; Beigang, R.
Journal Article
2009Fasergekoppeltes Terahertz-Spektroskopiesystem
Weinland, T.; Ellrich, F.; Molter, D.; Beigang, R.
Abstract
2008200 Hz rapid scan fiber-coupled terahertz time domain spectroscopy system
Ellrich, F.; Molter, D.; Weinland, T.; Theuer, M.; Jonuscheit, J.; Beigang, R.
Conference Paper
2008Fasergekoppeltes Terahertz-Spektroskopiesystem
Ellrich, F.; Weinland, T.; Theuer, M.; Jonuscheit, J.; Beigang, R.
Journal Article
2008Pump beam diameter dependent terahertz generation from surface emitters - experiment and simulation
Theuer, M.; Imhof, C.; Torosyan, G.; Ellrich, F.; Zengerle, R.; Beigang, R.
Conference Paper
2008Terahertz-Bildgebung in industriellen Anwendungen
Theuer, M.; Torosyan, G.; Ellrich, F.; Jonuscheit, J.; Beigang, R.
Journal Article
2008Terahertz-Messtechnik für die zerstörungsfreie Werkstoffprüfung: Möglichkeiten und Grenzen der THz-Messtechnik
Beigang, R.; Ellrich, F.; Torosyan, G.; Theuer, M.
Conference Paper
2008Thin-film measurements with THz-radiation
Ellrich, F.; Theuer, M.; Torosyan, G.; Jonuscheit, J.; Beigang, R.
Conference Paper