Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2020Verification of physical designs using an integrated reverse engineering flow for nanoscale technologies
Lippmann, B.; Unverricht, N.; Singla, A.; Ludwig, M.; Werner, M.; Egger, P.; Duebotzky, A.; Graeb, H.; Gieser, H.; Rasche, M.; Kellermann, O.
Journal Article
2019Integrated Flow for Reverse Engineering of Nanoscale Technologies
Lippmann, Bernhard; Werner, Michael; Unverricht, Niklas; Singla, Aayush; Egger, Peter; Dübotzky, Anja; Gieser, Horst; Rasche, Martin; Kellermann, Oliver; Graeb, Helmut
Conference Paper
2012Continuous fiber reinforced structural components: Combining polymerization and molding within a single machine
Bäck, G.; Egger, P.; Berg, L.F.
Journal Article
1996ESD monitor circuit. A tool to investigate the susceptibility and failure mechanisms of the charged device model
Egger, P.; Gieser, H.; Kropf, R.; Guggenmos, X.
Journal Article
1995CDM-Testervergleich anhand eines Monitor-Schaltkreises
Egger, P.; Kropf, R.; Gieser, H.; Guggenmos, X.
Conference Paper
1995ESD monitor circuit. A tool to investigate the susceptibility and failure mechanisms of the charged device model
Egger, P.; Gieser, H.; Kropf, R.; Guggenmos, X.
Conference Paper
1994Analysis of HBM ESD testers and specifications using a fourth-order lumped element model
Verhaege, K.; Roussel, P.J.; Groeseneken, G.; Maes, H.E.; Gieser, H.; Russ, C.; Egger, P.; Guggenmos, X.; Kuper, F.G.
Conference Paper
1994A CMD-only reproducible field degradation and its reliability aspect
Gieser, H.A.; Egger, P.; Reiner, J.C.; Herrmann, M.R.
Conference Paper
1994Compact electro-thermal simulation of ESD-protection elements
Russ, C.; Gieser, H.; Egger, P.; Irl, S.
Conference Paper
1994Influence of tester parasitics on "charged devive model"-failure thresholds
Gieser, H.A.; Egger, P.
Conference Paper