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| 2019 | A novel high photon detection effciency silicon photomultiplier with shallow junction in 0.35 μm CMOS
D'Ascenzo, Nicola; Antonecchia, Emanuele; Brensing, Andreas; Brockherde, Werner; Dreiner, Stefan; Ewering, Johannes; Kuhn, Marvin; Schmidt, Andrei; Stein, Peter vom; Wang, Weidong; Zhou, Zhenliang; Xie, Qingguo | Journal Article |
| 2019 | Post-CMOS 3D-integration of a nanopellistor
Münchenberger, Finja M.; Dreiner, Stefan; Kappert, Holger; Vogt, Holger | Conference Paper |
| 2019 | Silicon photomultipliers with area up to 9 mm2 in a 0.35 μm CMOS process
Liang, Xiao; D'Ascenzo, Nicola; Brockherde, Werner; Dreiner, Stefan; Schmidt, Andrei; Xie, Qingguo | Journal Article |
| 2018 | Design and characterization of a silicon photomultiplier in 0.35 μm CMOS
D'Ascenzo, Nicola; Brockherde, Werner; Dreiner, Stefan; Schwinger, Alexander; Schmidt, Andrei; Xie, Q. | Journal Article |
| 2018 | Evaluation of a median threshold based EEPROM-PUF concept implemented in a high temperature SOI CMOS technology
Willsch, Benjamin; Heesen, Marius te; Hauser, Julia; Dreiner, Stefan; Kappert, Holger; Vogt, Holger | Conference Paper |
| 2018 | New concept for post-CMOS pellistor integration
Münchenberger, Finja M.; Dreiner, Stefan; Kappert, Holger; Vogt, Holger | Conference Paper |
| 2017 | Analysis of semiconductor process variations by means of hierarchical median polish
Willsch, Benjamin; Hauser, Julia; Dreiner, Stefan; Goehlich, Andreas; Kappert, Holger; Vogt, Holger | Conference Paper |
| 2017 | Analytical model for thin-film SOI PIN-diode leakage current
Schmidt, Andrei; Dreiner, Stefan; Vogt, Holger; Goehlich, Andreas; Paschen, Uwe | Journal Article |
| 2017 | First results on DEPFET Active Pixel Sensors fabricated in a CMOS foundry - a promising approach for new detector development and scientific instrumentation
Aschauer, Stefan; Majewski, Petra; Lutz, Gerhard; Soltau, Heike; Holl, Peter; Hartmann, Robert; Schlosser, Dieter; Paschen, Uwe; Weyers, Sascha; Dreiner, Stefan; Klusmann, Miriam; Hauser, Julia; Kalok, David; Bechteler, Alois; Heinzinger, Klaus; Porro, Matteo; Titze, Barbara; Strüder, Lothar | Journal Article |
| 2017 | High temperature EEPROM using a differential approach for high reliability
Kappert, Holger; Braun, Sebastian; Alfring, Michael; Kordas, Norbert; Kelberer, Andreas; Dreiner, Stefan; Kokozinski, Rainer | Journal Article, Conference Paper |
| 2017 | Implementation of an integrated differential readout circuit for transistor-based physically unclonable functions
Willsch, Benjamin; Müller, Kai-Uwe; Zhang, Qi; Hauser, Julia; Dreiner, Stefan; Stanitzki, Alexander; Kappert, Holger; Kokozinski, Rainer; Vogt, Holger | Conference Paper |
| 2016 | Entwicklung und Untersuchung von Photodetektoren in einer Dünnfilm-SOI-Technologie
Schmidt, Andrei
: Vogt, Holger (Erstgutachter); Stöhr, Andreas (Zweitgutachter); Dreiner, Stefan (Betreuer) | Dissertation |
| 2016 | Experimental reliability studies and SPICE simulation for EEPROM at temperatures up to 450°C
Kelberer, Andreas; Dreiner, Stefan; Grella, Katharina; Dittrich, Dirk; Kappert, Holger; Vogt, Holger; Paschen, Uwe | Journal Article |
| 2016 | High temperature GaN gate driver in SOI CMOS technology
Kappert, Holger; Braun, Sebastian; Kordas, Norbert; Dreiner, Stefan; Kokozinski, Rainer | Journal Article, Conference Paper |
| 2016 | HOT-300 - a multidisciplinary technology approach targeting microelectronic systems at 300 °C operating temperature
Vogt, Holger; Altmann, Frank; Braun, Sebastian; Celik, Yusuf; Dietrich, Lothar; Dietz, Dorothee; Dijk, Marius van; Dreiner, Stefan; Döring, Ralf; Gabler, Felix; Goehlich, Andreas; Hutter, Matthias; Ihle, Martin; Kappert, Holger; Kordas, Norbert; Kokozinski, Rainer; Naumann, Falk; Nowak, Torsten; Oppermann, Hermann; Partsch, Uwe; Petzold, Matthias; Roscher, Frank; Rzepka, Sven; Schubert, Ralph; Weber, Constanze; Wiemer, Maik; Wittler, Olaf; Ziesche, Steffen | Conference Paper |
| 2016 | Optimierung und Modellierung von Bauelementen in einer 0,35 μm-CMOS-Hochtemperaturtechnologie
Kelberer, Andreas
: Vogt, Holger (Gutachter); Fiedler, Horst-Lothar (Gutachter); Dreiner, Stefan (Betreuer) | Dissertation |
| 2016 | Statistical tests to determine spatial correlations in the response behavior of PUFs
Willsch, Benjamin; Hauser, Julia; Dreiner, Stefan; Goehlich, Andreas; Vogt, Holger | Conference Paper |
| 2015 | Beschleunigte Zuverlässigkeitsuntersuchung von Siliziumnitrid bei schmalbandiger UV-Bestrahlung
Schmidt, Andrei; Dreiner, Stefan; Vogt, Holger; Paschen, Uwe | Conference Paper |
| 2015 | Experimental reliability studies and SPICE simulation for EEPROM at temperatures up to 450°C
Kelberer, Andreas; Dreiner, Stefan; Grella, Katharina; Dittrich, Dirk; Kappert, Holger; Vogt, Holger; Paschen, Uwe | Conference Paper |
| 2015 | Experimental reliability studies and SPICE simulation for EEPROM at temperatures up to 450°C
Kelberer, Andreas; Dreiner, Stefan; Grella, Katharina; Dittrich, Dirk; Kappert, Holger; Vogt, Holger; Paschen, Uwe | Conference Paper, Journal Article |
| 2015 | High temperature SOI CMOS technology and circuit realization for applications up to 300°C
Kappert, Holger; Kordas, Norbert; Dreiner, Stefan; Paschen, Uwe; Kokozinski, Rainer | Conference Paper |
| 2015 | Thin-film SOI PIN-diode leakage current dependence on back-gate-potential and HCI traps
Schmidt, Andrei; Dreiner, Stefan; Vogt, Holger; Paschen, Uwe | Conference Paper |
| 2014 | High temperature 0.35 micron Silicon-on-Insulator CMOS technology
Kappert, Holger; Dreiner, Stefan; Kordas, Norbert; Schmidt, Alexander; Paschen, Uwe; Kokozinski, Rainer | Conference Paper |
| 2014 | Reliability of CMOS on silicon-on-insulator for use at 250 °C
Grella, Katharina; Dreiner, Stefan; Vogt, Holger; Paschen, Uwe | Journal Article |
| 2014 | Zuverlässigkeitsuntersuchungen an einer hochtemperaturtauglichen SOI-CMOS-Technologie
Dreiner, Stefan; Grella, Katharina; Heiermann, Wolfgang; Kelberer, Andreas; Kappert, Holger; Vogt, Holger; Paschen, Uwe | Journal Article |
| 2013 | Development of high voltage for a 0.18 µm CMOS process: A heterogeneous technology alliance project
Dreiner, Stefan; Weyers, Sascha; Mehta, M.; Paschen, Uwe | Book Article |
| 2013 | High temperature characterization up to 450°C of MOSFETs and basic circuits realized in a Silicon-on-Insulator (SOI) CMOS-technology
Grella, Katharina; Dreiner, Stefan; Schmidt, Alexander; Heiermann, Wolfgang; Kappert, Holger; Vogt, Holger; Paschen, Uwe | Journal Article |
| 2013 | High temperature reliability investigations up to 350 °C of gate oxid capacitors realized in a Silicon-on-Insulator CMOS-technology
Grella, Katharina; Dreiner, Stefan; Vogt, Holger; Paschen, Uwe | Conference Paper |
| 2013 | Reliability investigations up to 350°C of gate oxid capacitors realized in a Silicon-on-Insulator CMOS-technology
Grella, Katharina; Dreiner, Stefan; Vogt, Holger; Paschen, Uwe | Journal Article |
| 2012 | High temperature characterization up to 450 °C of MOSFETs and basic circuits realized in a Silicon-on-Insulator (SOI) CMOS-technology
Grella, Katharina; Dreiner, Stefan; Schmidt, Alexander; Heiermann, Wolfgang; Kappert, Holger; Vogt, Holger; Paschen, Uwe | Conference Paper |
| 2012 | Reducing the impact of process variations on the sensitivity of CMOS photodiodes
Hochschulz, Frank; Dreiner, Stefan; Vogt, Holger; Paschen, Uwe | Book Article |
| 2011 | CMOS photodiodes for narrow linewidth applications
Hochschulz, Frank; Dreiner, Stefan; Vogt, Holger; Paschen, Uwe | Conference Paper |