Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2014Anti-counterfeiting technique in the micro region for micro and nano systems
Luczak, F.; Dost, M.; Seiler, B.; Winkler, T.; Michel, B.
Book Article
2014In-situ analysis of an industrial material compound package by means of X-ray micro tomography and digital volume correlation
Haase, S.; Noack, E.; Scheiter, L.; Seiler, B.; Dost, M.; Rzepka, S.
Conference Paper
2014Interface characterisation at electronic packages by means af nanoscale deformation analysis
Keller, J.; Zander, T.; Schulz, M.; Springborn, M.; Lauenstein, T.; Dost, M.; Wunderle, B.; Michel, B.
Book Article
2014Untersuchung des Risswachstums in 3D - Verformungsmessung mittels Röntgenmikrotomographie
Zeismann, F.; Bode, B.; Motoyashiki-Besel, Y.; Brueckner-Foit, A.; Tomizato, F.; Kobayashi, M.; Toda, H.; Uesugi, K.; Takeuchi, A.; Suzuki, Y.; Haase, S.; Erb, R.; Seiler, B.; Dost, M.
Conference Paper
2013Imaging device and method for optical 3d deformation characterization of materials. composites and components.
Dost, M.; Scheiter, L.; Seiler, B.; Lauenstein, T.; Haase, S.
Conference Paper
2011Correlation based local measurement of small CTE for high temperature power electronics packaging
Hammacher, J.; Dost, M.; Seiler, B.; Scheiter, L.; Noack, E.; Rzepka, S.; Michel, B.
Conference Paper
2011Three-dimensional deformation analysis of MEMS/NEMS by means of X-ray computer-tomography
Hammacher, J.; Dost, M.; Faust, W.; Scheiter, L.; Erb, R.; Michel, B.
Conference Paper
2007Experimental Vibration Analyses by Laser Vibrometer under Vacuum Conditions
Schnitzer, R.; Rümmler, N.; Dost, Mi.; Michel, B.; Hauck, T.
Conference Paper
2006Advanced packages with buried dies
Sommer, J.-P.; Döring, R.; Dost, M.; Michel, B.
Conference Paper
2006Verfahren zur Erfassung von lokalen Eigenspannungen in Festkoerperobjekten mit einer Ionenstrahltechnik
Auersperg, J.; Lieske, D.; Keller, J.; Vogel, D.; Michel, B.; Gollhardt, A.; Dost, M.
Patent
2006Zuverlässigkeitsprognostik von in der Leiterplatte integrierten Chips
Sommer, J.-P.; Döring, R.; Dost, M.; Michel, B.
Conference Paper
2005Digital image correlation - a versatile experimental tool to improve reliability, security and lifetime
Dost, M.; Seiler, B.; Erb, R.; Michel, B.
Abstract
2005Quantitative Analysis of the Adhesive Strength as Tool for the Reliability-focused Design of Micro-technical Structures
Seiler, B.; Auersperg, J.; Noack, E.; Lampke, T.; Dost, M.
Conference Paper
2005Thermal Lap Shear Tests on MEMS Interconnect Solder joints
Vogel, J.; Dudek, R.; Faust, W.; Dost, M.; Michel, B.
Conference Paper
2005Vibration Analyses for Function and Reliability Estimation of Automotive Sensors by Laser Vibrometry
Rümmler, N.; Schnitzer, R.; Dost, Mi.; Michel, B.
Conference Paper
2004Mechanische Charakterisierung membranartiger Sonsorstrukturen
Winkler, T.; Seiler, B.; Dost, M.; Brokmann, G.; Übensee, H.; Rümmler, N.; Faust, W.; Sommer, J.-P.
Conference Paper
2003How to detect Edgar Allan Poe's 'purloined letter' - Or: Cross correlation algorithms in digitised video images for object identification, movement evaluation and deformation analysis
Dost, M.; Vogel, D.; Winkler, T.; Vogel, J.; Erb, R.; Kieselstein, E.; Michel, B.
Conference Paper
2003LONGLIFE - optical measuring techniques for reliability evaluation of MEMS
Dost, M.; Kieselstein, E.; Winkler, T.; Noack, E.
Abstract
2003Schadensanalyse an Komponenten der Mikrosystemtechnik und Mikroelektronik
Faust, W.; Dost, M.; Michel, B.
Conference Paper
2002Determination of packaging material properties utilizing image correlation techniques
Vogel, D.; Kühnert, R.; Dost, M.; Michel, B.
Journal Article
2001Experimentelle und numerische Methoden zur Charakterisierung von Mikrobauteilen
Sommer, J.-P.; Kieselstein, E.; Seiler, B.; Dost, M.; Michel, B.
Conference Paper
2000Characterisation of micromaterials and microcomponents by combination of microbending test and UNIDAC
Seiler, B.; Kieselstein, E.; Dost, M.; Wielage, B.; Michel, B.
Conference Paper
2000Characterization of Micro Materials and Micro Components by Combination of the Micro-Bending Test and UNIDAC
Michel, B.; Seiler, B.; Dost, M.; Wielage, B.; Kieselstein, E.; Winkler, T.; Dudek, R.; Auersperg, J.; Schubert, A.; Schneider, W.
Conference Paper
2000Modular loading and measuring system for material characterization of microcomponents
Vogel, J.; Dost, M.; Seebacher, S.; Osten, W.; Fassler, R.; Köpp, N.; Döring, R.; Sommer, J.-P.; Michel, B.
Conference Paper
2000Rapid prototyping of microcomponents and demonstrators in micro system technology
Fleischer, L.; Faust, W.; Dost, M.; Michel, B.; Vogel, J.; Zeidler, H.
Conference Paper
2000UNIDAC: Cross correlation based deformation analysis at digitised micrographs to study material behaviour and parameters in MST
Dost, M.; Kieselstein, E.; Erb, R.; Seiler, B.; Vogel, J.; Bombach, C.; Großer, V.; Vogel, D.; Michel, B.
Conference Paper
1999Analysis of field coupling effects in fracture by combining infrared thermography and FE-calculation
Vogel, J.; Dost, M.; Auersperg, J.; Faust, W.; Michel, B.
Journal Article
1999Correlation analysis at grey scale patterns in an in-situ measuring module for microsystem technology
Dost, M.; Rümmler, N.; Kieselstein, E.; Erb, R.; Hillmann, V.; Großer, V.
Book Article
1999Determination of material properties by the optical measuring procedure UNIDAC
Kieselstein, E.; Seiler, B.; Dost, M.; Michel, B.
Journal Article
1999Investigation of thermomechanical field coupling effects near crack tips by combining thermal emission analysis and FE-simulation
Vogel, J.; Auersperg, J.; Dost, M.; Faust, W.; Michel, B.
Book Article
1997Characterization of composite materials by means of correlation analysis of grey scale patterns
Kieselstein, E.; Penno, M.; Wielage, B.; Dost, M.; Michel, B.
Conference Paper
1997Investigation of crack temperature fields by means of infrared thermography and FE calculations
Vogel, J.; Auersperg, J.; Dost, M.; Michel, B.
Conference Paper
1997Testing devices for well defined mechanical and thermal loading of microcomponents
Dost, M.; Dietrich, D.; Vogel, J.; Sommer, J.-P.; Großer, V.; Michel, B.
Conference Paper
1997Verfahren zur Ermittlung von Materialkennwerten in mikroskopisch dimensionierten Prueflingsbereichen
Dost, M.; Kaempfe, B.; Kuehnert, R.; Michel, B.; Traenkner, K.
Patent
1997Verfahren zur feldmaessigen Bestimmung von Deformationszustaenden in mikroskopisch dimensionierten Prueflingsbereichen
Kuehnert, R.; Schubert, A.; Dost, M.; Vogel, D.; Kaempfe, B.; Michel, B.
Patent
1995Anwendungen der Laser Scanning Mikroskopie in der Mikrosystemtechnik
Faust, W.; Dudek, R.; Michel, B.; Dost, M.
Conference Paper
1995Anwendungen der Laser Scanning Mikroskopie in der Mikrosystemtechnik
Faust, W.; Dudek, R.; Michel, B.; Dost, M.
Conference Paper
1995Anwendungen der Laser Scanning Mikroskopie in der Mikrotechnik
Faust, W.; Dost, M.
Conference Paper
1994Fatigue crack evaluation in electronics
Michel, B.; Dost, M.
Conference Paper