Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2019Learning Quality Rating of As-Cut mc-Si Wafers via Convolutional Regression Networks
Demant, M.; Virtue, P.; Kovvali, A.; Yu, S.X.; Rein, S.
Journal Article
2018About the Relevance of Defect Features in As-Cut Multicrystalline Silicon Wafers on Solar Cell Performance
Kovvali, A.; Demant, M.; Trötschler, T.; Haunschild, J.; Rein, S.
Conference Paper
2018Analysis of grain structure evolution based on optical measurements of mc-Si wafers
Strauch, T.; Demant, M.; Krenckel, P.; Riepe, S.; Rein, S.
Journal Article
2018Deep Learning Approach to Inline Quality Rating and Mapping of Multi-Crystalline Si-Wafers
Demant, M.; Virtue, P.; Kovvali, A.S.; Yu, S.X.; Rein, S.
Conference Paper
2017Bifacial p-type silicon PERL solar cells with screen-printed pure silver metallization and 89% bifaciality
Lohmüller, E.; Werner, S.; Norouzi, M.H.; Mack, S.; Demant, M.; Gutscher, S.; Saint-Cast, P.; Wasmer, S.; Wöhrle, N.; Bitnar, B.; Steckemetz, S.; Palinginis, P.; Neuhaus, H.; König, M.; Wolf, A.
Conference Paper
2017Grain boundaries and dislocations in Si-bricks: Inline characterization on as-cut wafers
Strauch, T.; Demant, M.; Krenckel, P.; Riepe, S.; Rein, S.
Conference Paper, Journal Article
2017Identification of defect-suppressing grain boundaries in multicrystalline silicon based on measurements of as-cut wafers using advanced image processing
Strauch, T.; Demant, M.; Krenckel, P.; Riepe, S.; Rein, S.
Conference Paper
2017Impact of material and process variations on the distribution of multicrystalline silicon PERC cell efficiencies
Wasmer, S.; Greulich, J.; Höffler, H.; Wöhrle, N.; Demant, M.; Fertig, F.; Rein, S.
Journal Article
2017Key aspects for fabrication of p-type Cz-Si PERC solar cells exceeding 22% conversion efficiency
Werner, S.; Lohmüller, E.; Saint-Cast, P.; Greulich, J.M.; Weber, J.; Schmidt, S.; Moldovan, A.; Brand, A.A.; Dannenberg, T.; Mack, S.; Wasmer, S.; Demant, M.; Linse, M.; Ackermann, R.; Wolf, A.; Preu, R.
Conference Paper
2017Low-Ohmic Contacting of Laser-Doped p-Type Silicon Surfaces with Pure Ag Screen-Printed and Fired Contacts
Lohmüller, E.; Werner, S.; Norouzi, M.H.; Gutscher, S.; Demant, M.; Saint-Cast, P.; Linse, M.; Bitnar, B.; Palinginis, P.; Neuhaus, H.; Wolf, A.
Journal Article
2016Analysis of grain structure evolution based on optical measurements of mc Si wafers
Strauch, T.; Demant, M.; Krenckel, P.; Riepe, S.; Rein, S.
Journal Article
2016Analysis of grain structure evolution via image processing based on optical measurements of mc Si wafers
Strauch, T.; Demant, M.; Krenckel, P.; Riepe, S.; Rein, S.
Conference Paper
2016Incoming control of silicon wafers - detection and rating of micro-cracks
Demant, M.; Welschehold, T.; Oswald, M.; Bartsch, S.; Schönfelder, S.; Rein, S.
Presentation
2016Inline quality rating of multi-crystalline wafers based on photoluminescence images
Demant, M.; Rein, S.; Haunschild, J.; Strauch, T.; Höffler, H.; Broisch, J.; Wasmer, S.; Sunder, K.; Anspach, O.; Brox, T.
Journal Article, Conference Paper
2016Microcracks in silicon wafers I: Inline detection and implications of crack morphology on wafer strength
Demant, M.; Welschehold, T.; Oswald, M.; Bartsch, S.; Brox, T.; Schoenfelder, S.; Rein, S.
Journal Article
2016Microcracks in silicon wafers II: Implications on solar cell characteristics, statistics and physical origin
Demant, M.; Welschehold, T.; Kluska, S.; Rein, S.
Journal Article
2016Quality rating of silicon wafers - a pattern recognition approach
Demant, Matthias
: Weber, E.; Brox, T.
Dissertation
2015Impact of texture roughness on the front-side metallization of stencil-printed silicon solar cells
Lorenz, A.; Strauch, T.; Demant, M.; Fellmeth, T.; Barnes Hofmeister, T.; Linse, M.; Dannenberg, T.; Seiffe, J.; Clement, F.; Biro, D.; Reinecke, H.; Preu, R.
Journal Article
2015Investigating the impact of parameter and process variations on multicrystalline PERC cell efficiency
Wasmer, S.; Greulich, J.; Höffler, H.; Haunschild, J.; Demant, M.; Rein, S.
Conference Paper
2014Micro-cracks in silicon wafers and solar cells: Detection and rating of mechanical strength and electrical quality
Demant, M.; Oswald, M.; Welschehold, T.; Nold, S.; Bartsch, S.; Schoenfelder, S.; Rein, S.
Conference Paper
2014Two image processing tools to analyse alkaline texture and contact finger geometry in microscope images
Strauch, T.; Demant, M.; Lorenz, A.; Haunschild, J.; Rein, S.
Conference Paper
2013Comparing lifetime and photoluminescence imaging pattern recognition methodologies for predicting solar cell results based on as-cut wafer properties
Sinton, R.; Haunschild, J.; Demant, M.; Rein, S.
Journal Article
2013Evaluation and improvement of a feature-based classification framework to rate the quality of multicrystalline silicon wafers
Demant, M.; Höffler, H.; Schwaderer, D.; Seidl, A.; Haunschild, J.; Rein, S.
Conference Paper
2012Modelling of physically relevant features in photoluminescence images
Demant, M.; Greulich, J.; Glatthaar, M.; Haunschild, J.; Rein, S.
Journal Article, Conference Paper
2012Rating and sorting of mc-Si as-cut wafers in solar cell production using PL imaging
Haunschild, J.; Reis, I.E.; Chipei, T.; Demant, M.; Thaidigsmann, B.; Linse, M.; Rein, S.
Journal Article, Conference Paper
2011Detection and analysis of micro-cracks in multi-crystalline silicon wafers during solar cell production
Demant, M.; Rein, S.; Krisch, J.; Schoenfelder, S.; Fischer, C.; Bartsch, S.; Preu, R.
Conference Paper
2011In-line measurement of "trench structures" caused by the texturization of mc-silicon solar cells
Nievendick, J.; Zimmer, M.; Demant, M.; Krieg, A.; Rein, S.; Rentsch, J.
Journal Article
2011Optical Characterisation of Random Pyramid Texturization
Birmann, K.; Demant, M.; Rein, S.
Conference Paper
2011Verfahren zur Bereitstellung eines Vorhersagemodells für eine Rissdetektion und Verfahren zur Rissdetektion an einer Halbleiterstruktur
Demant, M.; Rein, S.; Krisch, J.
Patent
2010Analysis of luminescence images applying pattern recognition techniques
Demant, M.; Glatthaar, M.; Haunschild, J.; Rein, S.
Conference Paper
2010Appearance of rift structures created by acidic texturization and their impact on solar cell efficiency
Nievendick, J.; Demant, M.; Haunschild, J.; Krieg, A.; Souren, F.M.M.; Rein, S.; Zimmer, M.; Rentsch, J.
Conference Paper
2010Evaluating luminescence based voltage images of silicon solar cells
Glatthaar, M.; Haunschild, J.; Zeidler, R.; Demant, M.; Greulich, J.; Michl, B.; Warta, W.; Rein, S.; Preu, R.
Journal Article
2010Quality control of as-cut multicrystalline silicon wafers using photoluminescence imaging for solar cell production
Haunschild, J.; Glatthaar, M.; Demant, M.; Nievendick, J.; Motzko, M.; Rein, S.; Weber, E.R.
Journal Article