Fraunhofer-Gesellschaft

Publica

Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.
2019Low-temperature argon and ammonia plasma treatment of poly-3-hydroxybutyrate films: Surface topography and chemistry changes affect fibroblast cells in vitro
Surmenev, Roman A.; Chernozem, Roman V.; Syromotina, Dina S.; Oehr, Christian; Baumbach, T.; Krause, Bärbel; Boyandin, Anatoly N.; Dvoinina, L.M.; Volova, Tatiana G.; Surmeneva, Maria A.
Journal Article
20183D biodegradable scaffolds of polycaprolactone with silicate-containing hydroxyapatite microparticles for bone tissue engineering
Shkarina, Svetlana; Shkarin, Roman; Weinhardt, Venera; Melnik, Elizaveta; Vacun, Gabriele; Kluger, Petra; Loza, Kateryna; Epple, Matthias; Ivlev, Sergei I.; Baumbach, Tilo; Surmeneva, Maria A.; Surmenev, Roman A.
Journal Article
2016High-resolution synchrotron X-ray analysis of bioglass-enriched hydrogels
Gorodzha, Svetlana; Douglas, Timothy E.L.; Samal, Sangram K.; Detsch, Rainer; Cholewa-Kowalska, Katarzyna; Braeckmans, Kevin; Boccaccini, Aldo R.; Skirtach, Andre G.; Weinhardt, Venera; Baumbach, Tilo; Surmeneva, Maria A.; Surmenev, Roman A.
Journal Article
2014Growth and doping of semipolar GaN grown on patterned sapphire substrates
Scholz, F.; Meisch, T.; Caliebe, M.; Schörner, S.; Thonke, K.; Kirste, L.; Bauer, S.; Lazarev, S.; Baumbach, T.
Journal Article
2012A versatile indirect detector design for hard X-ray microimaging
Douissard, Paul Antoine; Cecilia, Angelica; Rochet, X.; Chapel, X.; Martin, Thierry G.; Kamp, Thomas van de; Helfen, Lukas; Baumbach, Tilo; Luquot, Linda; Xiao, X.; Meinhardt, Jürgen; Rack, Alexander
Journal Article
2009Moderne 2-D und 3-D abbildende Röntgenverfahren mit Synchrotronstrahlung
Baumbach, T.; Santos Rolo, T. dos; Ershov, A.; Helfen, L.; Lübbert, D.; Modregger, P.; Pelliccia, D.; Vagovic, P.; Xu, F.
Journal Article
2008Analysis of spatial cross-correlations in multi-constituent volume data
Rack, A.; Helfen, L.; Baumbach, T.; Kirste, S.; Banhart, J.; Schladitz, K.; Ohser, J.
Journal Article
2007X-ray detectors for NDE applications
Kroening, M.; Melkadze, R.G.; Lezhneva, T.M.; Khvedelidze, L.B.; Kalandadze, G.D.; Baumbach, T.; Berthold, A.
Conference Paper
2006Crystallite misorientation analysis in semiconductor wafers and ELO samples by rocking curve imaging
Mikulik, P.; Lübbert, D.; Pernot, P.; Helfen, L.; Baumbach, T.
Conference Paper, Journal Article
2006Investigation of hybrid pixel detector arrays by synchrotron-radiation imaging
Helfen, L.; Myagotin, A.; Pernot, P.; DiMichiel, M.; Mikulik, P.; Berthold, A.; Baumbach, T.
Conference Paper, Journal Article
2006Microsystem and microelectronic devices investigated by synchrotron-radiation imaging techniques
Helfen, L.; Myagotin, A.; Baumbach, T.; Dimichel, M.; Kröning, M.
Conference Paper
2005'In-situ' observation of dynamical diffraction by means of Medipix2 sensor crystal fulfilling Bragg condition
Mitschke, M.; Pernot, P.; Helfen, L.; Scherzer, S.; Zwerger, A.; Baumbach, T.
Conference Paper, Journal Article
2005Anordnung zur Detektion von Roentgenstrahlung und Verfahren zu deren Herstellung
Schreiber, J.; Baumbach, T.; Hirsch, O.
Patent
2005Distribution and Burgers vectors of dislocations in semiconductor wafers investigated by rocking-curve imaging
Lübbert, D.; Ferrari, C.; Mikulik, P.; Pernot, P.; Helfen, L.; Verdi, N.; Korytar, D.; Baumbach, T.
Journal Article
2005High-resolution three-dimensional imaging of flat objects by synchrotron-radiation computed laminography
Helfen, L.; Baumbach, T.; Mikulik, P.; Kiel, D.; Pernot, P.; Cloetens, P.; Baruchel, J.
Journal Article
2005Investigation of pore initiation in metal foams by synchrotron-radiation tomography
Helfen, L.; Baumbach, T.; Pernot, P.; Cloetens, P.; Stanzick, H.; Schladitz, K.; Banhart, J.
Journal Article
2005Local wing tilt analysis of laterally overgrown GaN by x-ray rocking curve imaging
Lübbert, D.; Baumbach, T.; Mikulik, P.; Pernot, P.; Helfen, L.; Köhler, R.; Katona, T.M.; Keller, S.; DenBaars, S.P.
Journal Article
2005Materials investigation of gallium arsenide for direct converting energy sensitive x-ray detectors
Kröning, M.; Besse, I.; Baumbach, T.; Berthold, A.; Melkadze, R.G.; Lezhneva, T.M.; Khvedelidze, L.B.; Kalandadze, G.D.
Conference Paper
2005Three-dimensional imaging of cement microstructure evolution during hydration
Helfen, L.; Dehn, F.; Mikulik, P.; Baumbach, T.
Journal Article
2004A flat panel readout chip with 13-bit single counting for direct conversion of X-rays into a digital image
Hermann, R.; Holland, H.-J.; Baumbach, T.; Schreiber, J.
Conference Paper
2004Materials characterization of micro-devices
Schreiber, J.; Bendjus, B.; Köhler, B.; Melov, V.; Baumbach, T.
Conference Paper
2004Micro- and nano-NDE in the laboratory for acoustic diagnosis and quality assurance EADQ Dresden
Köhler, B.; Schreiber, J.; Bendjus, B.; Herms, M.; Melov, V.; Helfen, L.; Mikulik, P.; Baumbach, T.
Conference Paper
2004Synchrotron-radiation X-ray tomography: A method for the 3D verification of cement microstructure and its evolution during hydration
Helfen, L.; Dehn, F.; Mikulik, P.; Baumbach, T.
Conference Paper
2003Determination of structural properties of light materials - by three-dimensional synchotron-radiation imaging and image analysis
Helfen, L.; Baumbach, T.; Ohser, J.; Schladitz, K.
Journal Article
2003Investigation of the foaming process of metals by synchrotron-radiation imaging
Helfen, L.; Stanzick, H.; Ohser, J.; Schladitz, K.; Rejmankova-Pernot, P.; Banhart, J.; Baumbach, T.
Conference Paper
2003Synchrotron area diffractometry as a tool for spatial high-resolution three-dimensional lattice misorientation mapping
Mikulik, P.; Lubbert, D.; Korytar, D.; Pernot, P.; Baumbach, T.
Journal Article
2003Two-dimensional x-ray magnification based on a monolithic beam conditioner
Korytar, D.; Mikulik, P.; Ferrari, C.; Hrdy, J.; Baumbach, T.; Freund, A.; Kubena, A.
Journal Article
2002Advanced x-ray imaging techniques for semiconductor wafer characterisation
Baumbach, T.; Mikulik, P.; Korytar, D.; Pernot, P.; Lubbert, D.; Helfen, L.; Herms, M.; Landesberger, C.
Conference Paper
2002Process control in aluminium foam producing using real-time X-ray radioscopy
Stanzick, H.; Wichmann, M.; Weise, J.; Banhart, J.; Helfen, L.; Baumbach, T.
Journal Article
2002Process control in aluminum foam production using real-time x-ray radioscopy
Stanzick, H.; Wichmann, M.; Weise, J.; Helfen, L.; Baumbach, T.; Banhart, J.
Journal Article
2002Viewing the early stage of metal foam formation by computed tomography using synchrotron radiation
Helfen, L.; Baumbach, T.; Stanzick, H.; Banhart, J.; Elmoutaouakkil, A.; Cloetens, P.
Journal Article
2002X-ray diffuse scattering of p-type porous silicon
Buttard, D.; Bellet, D.; Dolino, G.; Baumbach, T.
Journal Article
2002X-ray imaging systems for NDT and general applications
Kröning, M.; Hirsch, O.; Shulgin, B.; Raikov, D.; Kidibaev, M.; Koroleva, T.; Hanke, R.; Baumbach, T.
Conference Paper
2001Coplanar and non-coplanar x-ray reflectivity characterization of lateral W/Si multilayer gratings
Mikulik, P.; Jergel, M.; Baumbach, T.; Majkova, E.; Pincik, E.
Journal Article
2001Metal foam evolution studied by synchrotron radioscopy
Banhart, J.; Stanzick, H.; Helfen, L.; Baumbach, T.
Journal Article
2001New dimension in radioscopic quality inspection for microelectronics and packaging
Baumbach, T.; Helfen, L.; Hanke, R.
Conference Paper
2001Observation of dislocation generation in highly strained quantum well lasers during operation
Mazuelas, A.; Dotor, M.L.; Golmayo, D.; Zeimer, U.; Baumbach, T.; Luebbert, D.; Grenzer, J.; Baruchel, J.
Journal Article
2001Real-time observation of aluminium foam sandwich production by synchrotron radioscopy
Banhart, J.; Stanzick, H.; Helfen, L.; Baumbach, T.
Journal Article
2001Real-time X-ray investigation of aluminium foam sandwich production
Banhart, J.; Stanzick, H.; Helfen, L.; Baumbach, T.; Nijhof, K.
Journal Article
2001Strain and temperature distribution in broad-area high-power laser diodes under operation determined by high resolution x-ray diffraction and topography
Zeimer, U.; Grenzer, J.; Baumbach, T.; Lübbert, D.; Mazuelas, A.; Erbert, G.
Journal Article
2001Viewing the early stage of foam formation by high-resolution computed tomography
Helfen, L.; Baumbach, T.; Stanzick, H.; Banhart, J.; Elmoutaouakkil, A.; Cloetens, P.; Schladitz, K.
Conference Paper
2000Grazing incidence x-ray studies of twist-bonded Si/Si and Si/SiO2 interfaces
Buttard, D.; Eymery, J.; Rieutord, F.; Fournel, F.; Lübbert, D.; Baumbach, T.; Moriceau, H.
Journal Article
2000High resolution quality inspection for microelectronics and packaging by X-ray scattering and imaging techniques using synchrotron radiation
Baumbach, T.; Hönig, V.; Helfen, L.; Lübbert, D.
Conference Paper
2000High-Resolution Radioscopy and Tomography for Light Materials and Devices
Helfen, L.; Baumbach, T.; Banhart, J.; Stanzick, H.; Cloetens, P.; Ludwig, W.; Baruchel, J.
Conference Paper
2000Holographische Tomographie und mikrometeraufgelöste Diffraktometrie
Baumbach, T.; Lübbert, D.; Helfen, L.; Ludwig, W.; Baruchel, J.
Conference Paper
2000In-situ monitoring of metal foam evolution and decay
Stanzick, H.; Banhart, J.; Helfen, L.; Baumbach, T.
Conference Paper
2000In-situ observation of the foaming process in aluminium by means of x-ray radioscopy
Stanzick, H.; Banhart, J.; Helfen, L.; Baumbach, T.
Conference Paper
2000Mu-m-resolved high resolution x-ray diffraction imaging for semiconductor quality control
Lübbert, D.; Baumbach, T.; Härtwig, J.; Boller, E.; Pernot, E.
Journal Article
2000Nanofocus CT - A New Dimension in Radioscopic Inspection on Micro Materials
Hanke, R.; Baumbach, T.
Conference Paper
2000Neue Möglichkeiten zur Zerstörungsfreien Baugruppeninspektion
Hönig, V.; Baumbach, T.
Journal Article
2000A New Method for Non-Destrucitve Testing: Phase Contrast Radiography and Tomography (Holo-Tomography)
Baumbach, T.; Helfen, L.; Boller, E.; Cloetens, P.; Kröning, M.
Journal Article
2000Strain and Shape Analysis of Multilayer Surface Gratings by Coplanar and by Grazing-Incidence X-Ray Diffraction
Baumbach, T.; Lübbert, D.; Gailhanou, M.
Journal Article
2000Strain Relaxation in Surface Nano-Structures Studied by X-Ray Diffraction Methods
Baumbach, T.; Lübbert, D.; Gailhanou, M.
Journal Article
2000Strain-driven transition from stepped interfaces to regularly spaced macrosteps in (GaIn)As/Ga(PAs) symmetrically strained superlattices
Giannini, C.; Baumbach, T.; Lübbert, D.; Felici, R.; Tapfer, L.; Marschner, T.; Stolz, W.; Jin-Phillipp, N.Y.; Phillipp, F.
Journal Article
2000Zerstörungsfreie Prüfung elektronischer Baugruppen und Werkstoffcharakterisierung
Baumbach, T.
Journal Article
1999Appendix: Quantum Mechanical Approach of Born and Distorted-Wave Born Approximations
Baumbach, T.; Mikulik, P.
Book Article
1999Elastic Stress Relaxation in GaInAsP Quantum Wires on InP
Baumbach, T.; Lübbert, D.; Mazuelas, A.; Paris, G.; Jenichen, B.; Kojima, T.; Arai, S.
Journal Article
1999Grazing Incidence Diffraction by Laterally Patterned Semiconductor Nanostructures
Baumbach, T.; Lübbert, D.
Journal Article
1999Handbuch der Zerstörungsfreien Prüfung im Verlag R. Oldenbourg
Kröning, M.; Baumbach, T.
Conference Paper
1999High-resolution X-ray scattering from thin films and multilayers
Holy, V.; Pietsch, U.; Baumbach, T.
Book
1999In Situ Characterization of Strain Distribution in Broad-Area High-Power Lasers under Operation by High-Resolution X-Ray Diffraction and Topography Using Synchrotron Radiation
Zeimer, U.; Baumbach, T.; Grenzer, J.; Lübbert, D.; Pietsch, U.; Mazuelas, A.; Erbert, G.
Journal Article
1999In-plane strain distribution in free-standing GaAs/InGaAs/GaAs single quantum well surface nanostructures on GaAs(001)
Pietsch, U.; Baumbach, T.; Darowski, N.; Forchel, A.; Wang, K.H.; Wiebach, T.; Ulyanenkov, A.
Journal Article
1999Interface interaction energy in solid media
Ponti, S.; Baumbach, T.
Journal Article
1999Non-Uniform Strain in Epitaxial Surface Gratings: Beyond the Ordinary Elastic Description
Ponti, S.; Baumbach, T.
Journal Article
1999Phasenkontrastradiographie und -tomographie, eine neue Methode für die Mikro-ZfP
Baumbach, T.; Helfen, L.; Boller, E.; Ludwig, W.; Cloetens, P.
Conference Paper
1999Strain investigation of low strained buried gratings by grazing incidence X-Ray diffraction and elasticity theory
Lübbert, D.; Baumbach, T.; Ponti, S.; Pietsch, U.; Leprince, L.; Schneck, J.; Talneau, A.
Journal Article
1999Strain Relaxation in Surface Nano-Structures Studied by X-Ray Diffraction Methods
Baumbach, T.; Lübbert, D.; Gailhanou, M.
Journal Article
1999X-ray reflection by rough multilayer gratings: Dynamical and kinematical scattering
Baumbach, T.; Mikulik, P.
Journal Article
1999X-ray reflectivity by rough multilayers
Baumbach, T.; Mikulik, P.
Book Article
1999X-ray Reflectivity Investigation of Thin P-Type Porous Silicon Layers
Buttard, D.; Dolino, G.; Bellet, D.; Baumbach, T.; Rieutord, F.
Journal Article
1999X-Ray Structure Investigation of Lateral Surface Nanostructures - A Full Quantitative analysis of Non-Uniform Lattice Strain
Baumbach, T.; Lübbert, D.; Gailhanou, M.
Journal Article
1998(X-ray) reflection by multilayer surface gratings
Mikulik, P.; Baumbach, T.
Journal Article
1998Grazing incidence diffraction by epitaxial multilayered gratings
Baumbach, T.; Lübbert, D.; Pietsch, U.; Darowski, N.; Leprince, L.; Talneau, A.; Schneck, J.
Journal Article
1998In-plane strain and strain relaxation in laterally patterned periodic arrays of protect (Si/SiGe) quantum wires and dot arrays
Darowski, N.; Pietsch, U.; Zhuang, Y.; Zerlauth, S.; Bauer, G.; Lübbert, D.; Baumbach, T.
Journal Article
1998Interface dilution and morphology of CdTe/MnTe superlattices studied by small angle (X-ray) scattering
Eymery, J.; Hartmann, J.H.; Baumbach, T.
Journal Article
1998Residual strain in buried and non-buried semiconductor nanostructures
Lübbert, D.; Baumbach, T.; Leprince, L.; Schneck, J.; Talneau, A.; Felici, R.
Book Article
1998Strain-induced patterning in superlattices. Comparison of morphological ordering and strain ordering
Baumbach, T.; Giannini, C.; Lübbert, D.; Felici, R.; Tapfer, L.; Marschner, T.; Stolz, W.
Book Article
1998Structural characterisation of (GaAs) surface wire structure by triple axis (X-ray) grazing incidence diffraction
Darowski, N.; Paschke, K.; Pietsch, U.; Wang, K.; Baumbach, G.; Forchel, A.; Lübbert, D.; Baumbach, T.
Journal Article
1998Thin layers and multilayers of porous silicon X-ray diffraction investigation
Buttard, D.; Bellet, D.; Dolino, G.; Baumbach, T.
Journal Article